Arama Sonuçları Computer-aided engineering. - Daraltılmış: Computer engineering.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dComputer-aided$002bengineering.$0026qf$003dSUBJECT$002509Konu$002509Computer$002bengineering.$002509Computer$002bengineering.$0026ps$003d300?dt=list
2026-03-20T10:26:57Z
Information and Software Technologies 30th International Conference, ICIST 2024, Kaunas, Lithuania, October 17-18, 2024, Proceedings
ent://SD_ILS/0/SD_ILS:607581
2026-03-20T10:26:57Z
2026-03-20T10:26:57Z
Yazar Lopata, Audrius. editor. Gudonienė, Daina. editor. (orcid)0000-0002-6338-5556 Butkienė, Rita. editor. (orcid)0000-0003-3250-4599 Čeponis, Jonas. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-84263-4">https://doi.org/10.1007/978-3-031-84263-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Information and Software Technologies 29th International Conference, ICIST 2023, Kaunas, Lithuania, October 12-14, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:602321
2026-03-20T10:26:57Z
2026-03-20T10:26:57Z
Yazar Lopata, Audrius. editor. Gudonienė, Daina. editor. (orcid)0000-0002-6338-5556 Butkienė, Rita. editor. (orcid)0000-0003-3250-4599 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-48981-5">https://doi.org/10.1007/978-3-031-48981-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in Manufacturing II Volume 1 - Solutions for Industry 4.0
ent://SD_ILS/0/SD_ILS:485006
2026-03-20T10:26:57Z
2026-03-20T10:26:57Z
Yazar Trojanowska, Justyna. editor. Ciszak, Olaf. editor. Machado, José Mendes. editor. Pavlenko, Ivan. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-030-18715-6">https://doi.org/10.1007/978-3-030-18715-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:618440
2026-03-20T10:26:57Z
2026-03-20T10:26:57Z
Yazar Hollstein, Thomas. editor. Raik, Jaan. editor. Kostin, Sergei. editor. Tšertov, Anton. editor. O'Connor, Ian. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-67104-8">https://doi.org/10.1007/978-3-319-67104-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Tests and Proofs 11th International Conference, TAP 2017, Held as Part of STAF 2017, Marburg, Germany, July 19-20, 2017, Proceedings
ent://SD_ILS/0/SD_ILS:615981
2026-03-20T10:26:57Z
2026-03-20T10:26:57Z
Yazar Gabmeyer, Sebastian. editor. Johnsen, Einar Broch. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-61467-0">https://doi.org/10.1007/978-3-319-61467-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:618293
2026-03-20T10:26:57Z
2026-03-20T10:26:57Z
Yazar Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-46097-0">https://doi.org/10.1007/978-3-319-46097-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>