Arama Sonuçları Contamination (Technology) - Daraltılmış: Contamination (Technology)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dContamination$002b$002528Technology$002529$0026qf$003dSUBJECT$002509Konu$002509Contamination$002b$002528Technology$002529$002509Contamination$002b$002528Technology$002529$0026ps$003d300$0026isd$003dtrue?dt=list2025-04-03T06:45:36ZIntroduction to contamination control and cleanroom technologyent://SD_ILS/0/SD_ILS:3006692025-04-03T06:45:36Z2025-04-03T06:45:36ZYazar Ramstorp, Matts. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527613120">http://dx.doi.org/10.1002/9783527613120</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Contamination and ESD control in high technology manufacturingent://SD_ILS/0/SD_ILS:2494742025-04-03T06:45:36Z2025-04-03T06:45:36ZYazar Welker, R. W. Nagarajan, R. (Ramamurthy) Newberg, Carl E. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201423">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201423</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Formation testing : pressure transient and contamination analysisent://SD_ILS/0/SD_ILS:3418432025-04-03T06:45:36Z2025-04-03T06:45:36ZYazar Chin, Wilson C., author.<br/>Yer Numarası ONLINE(341843.1)<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118831175">http://dx.doi.org/10.1002/9781118831175</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9781118831175">http://onlinelibrary.wiley.com/book/10.1002/9781118831175</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63551">http://www.books24x7.com/marc.asp?bookid=63551</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Characterization of impurities and degradants using mass spectrometryent://SD_ILS/0/SD_ILS:2986822025-04-03T06:45:36Z2025-04-03T06:45:36ZYazar Pramanik, Birendra N., 1944- Lee, Mike S., 1960- Chen, Guodong. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470921371">An electronic book accessible through the World Wide Web; click for information</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=693190">Click here to view book</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy1114/2010023283-b.html">http://catdir.loc.gov/catdir/enhancements/fy1114/2010023283-b.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Isolation technology a practical guideent://SD_ILS/0/SD_ILS:2857772025-04-03T06:45:36Z2025-04-03T06:45:36ZYazar Coles, Tim P.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420025842">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Contamination of electronic assembliesent://SD_ILS/0/SD_ILS:1104962025-04-03T06:45:36Z2025-04-03T06:45:36ZYazar Pecht, Michael.<br/>Yer Numarası TK7870.15 C66 2003<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Contamination control in practiceent://SD_ILS/0/SD_ILS:3022592025-04-03T06:45:36Z2025-04-03T06:45:36ZYazar Ramstorp, Matts. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527612604">http://dx.doi.org/10.1002/9783527612604</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Identification and determination of impurities in drugsent://SD_ILS/0/SD_ILS:2541112025-04-03T06:45:36Z2025-04-03T06:45:36ZYazar Görög, S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444828996">http://www.sciencedirect.com/science/book/9780444828996</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Analytical artifacts GC, MS, HPLC, TLC, and PCent://SD_ILS/0/SD_ILS:2529342025-04-03T06:45:36Z2025-04-03T06:45:36ZYazar Middleditch, Brian S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444871589">http://www.sciencedirect.com/science/book/9780444871589</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>