Arama Sonuçları Control engineering. - Daraltılmış: Reliability (Engineering)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dControl$002bengineering.$0026qf$003dSUBJECT$002509Subject$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ps$003d300?2026-02-20T21:12:06ZReliability analysis of modern power systemsent://SD_ILS/0/SD_ILS:5990182026-02-20T21:12:06Z2026-02-20T21:12:06ZYazar Saket, R. K., editor. Sanjeevikumar, Padmanaban, 1978-<br/>Yer Numarası TA169 .S234 2024<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk analysis in engineering and economicsent://SD_ILS/0/SD_ILS:5457262026-02-20T21:12:06Z2026-02-20T21:12:06ZYazar Ayyub, Bilal M., author.<br/>Yer Numarası T174.5 .A99 2014<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466518261">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:2493822026-02-20T21:12:06Z2026-02-20T21:12:06ZYazar Raheja, Dev. Gullo, Louis J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design for reliability information and computer-based systemsent://SD_ILS/0/SD_ILS:2498792026-02-20T21:12:06Z2026-02-20T21:12:06ZYazar Bauer, Eric.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Maintaining mission critical systems in a 24/7 environmentent://SD_ILS/0/SD_ILS:2494852026-02-20T21:12:06Z2026-02-20T21:12:06ZYazar Curtis, Peter M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk analysis in engineering and economicsent://SD_ILS/0/SD_ILS:5392592026-02-20T21:12:06Z2026-02-20T21:12:06ZYazar Ayyub, Bilal M., author.<br/>Yer Numarası T174.5 .A98 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135438999">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>