Arama Sonuçları Counting. - Daraltılmış: Transmission electron microscopy.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dCounting.$0026qf$003dSUBJECT$002509Konu$002509Transmission$002belectron$002bmicroscopy.$002509Transmission$002belectron$002bmicroscopy.$0026ic$003dtrue$0026ps$003d300?2026-06-16T12:22:11ZCharacterization of radiation-damage by transmission electron microscopyent://SD_ILS/0/SD_ILS:5382852026-06-16T12:22:11Z2026-06-16T12:22:11ZYazar Jenkins, M. L., 1949, author. Kirk, M. A., 1942-<br/>Yer Numarası TA418.6 .J46 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420034646">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Characterization of radiation-damage by transmission electron microscopyent://SD_ILS/0/SD_ILS:5449922026-06-16T12:22:11Z2026-06-16T12:22:11ZYazar Jenkins, M. L., 1949, author. Kirk, M. A., 1942-<br/>Yer Numarası TA418.6 .J46 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420034646">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>