Arama Sonu&ccedil;lar&#305; Critical - Daralt&#305;lm&#305;&#351;: Reliability (Engineering) SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dCritical$0026qf$003dSUBJECT$002509Konu$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026te$003dILS$0026ps$003d300?dt=list 2026-03-16T12:37:54Z Maintaining mission critical systems in a 24/7 environment ent://SD_ILS/0/SD_ILS:596287 2026-03-16T12:37:54Z 2026-03-16T12:37:54Z Yazar&#160;Curtis, Peter M., author.<br/>Yer Numaras&#305;&#160;TA169 .C87 2021<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506133">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506133</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability of safety-critical systems : theory and application ent://SD_ILS/0/SD_ILS:341773 2026-03-16T12:37:54Z 2026-03-16T12:37:54Z Yazar&#160;Rausand, Marvin.<br/>Yer Numaras&#305;&#160;ONLINE(341773.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653">http://public.eblib.com/choice/publicfullrecord.aspx?p=1637653</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118776353">http://dx.doi.org/10.1002/9781118776353</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintaining Mission Critical Systems in a 24/7 Environment ent://SD_ILS/0/SD_ILS:249925 2026-03-16T12:37:54Z 2026-03-16T12:37:54Z Yazar&#160;Curtis, Peter M., author.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Mission-critical and safety-critical systems handbook design and development for embedded applications ent://SD_ILS/0/SD_ILS:146227 2026-03-16T12:37:54Z 2026-03-16T12:37:54Z Yazar&#160;Fowler, Kim.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750685672">http://www.sciencedirect.com/science/book/9780750685672</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Maintaining mission critical systems in a 24/7 environment ent://SD_ILS/0/SD_ILS:249485 2026-03-16T12:37:54Z 2026-03-16T12:37:54Z Yazar&#160;Curtis, Peter M.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Design and analysis of accelerated tests for mission critical reliability ent://SD_ILS/0/SD_ILS:546254 2026-03-16T12:37:54Z 2026-03-16T12:37:54Z Yazar&#160;LuValle, Michael J., author.&#160;Lefevre, Bruce G.&#160;Kannan, SriRaman.<br/>Yer Numaras&#305;&#160;TA169.3 .L88 2004<br/>Elektronik Eri&#351;im&#160;<a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format:&#160;Kitap<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Reliability analysis, safety assessment and optimization : methods and applications in energy systems and other applications ent://SD_ILS/0/SD_ILS:597447 2026-03-16T12:37:54Z 2026-03-16T12:37:54Z Yazar&#160;Zio, Enrico, author.&#160;Li, Yan-Fu, author.<br/>Yer Numaras&#305;&#160;TA169 .Z57 2022<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119265856</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Photovoltaic module reliability ent://SD_ILS/0/SD_ILS:595739 2026-03-16T12:37:54Z 2026-03-16T12:37:54Z Yazar&#160;Wohlgemuth, J. (John), 1946- author.<br/>Yer Numaras&#305;&#160;TK8322<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119459019</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Dynamic system reliability : modelling and analysis of dynamic and dependent behaviors ent://SD_ILS/0/SD_ILS:595289 2026-03-16T12:37:54Z 2026-03-16T12:37:54Z Yazar&#160;Xing, Liudong, author.&#160;Levitin, Gregory, author.&#160;Wang, Chaonan, 1986- author.<br/>Yer Numaras&#305;&#160;TA169 .X56 2019<br/>Elektronik Eri&#351;im&#160;<a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119507642</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>