Arama Sonuçları Data Analysis - Daraltılmış: Reliability (Engineering)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dData$002bAnalysis$0026qf$003dSUBJECT$002509Konu$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ps$003d300$0026isd$003dtrue?2026-01-22T11:00:31ZApplied life data analysisent://SD_ILS/0/SD_ILS:3002482026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Nelson, Wayne, 1936- John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471725234">http://dx.doi.org/10.1002/0471725234</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability analysis and prediction with warranty data : issues, strategies, and methodsent://SD_ILS/0/SD_ILS:5431972026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Rai, Bharatendra K., author. Singh, Nanua.<br/>Yer Numarası K1032 .C6 R35 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439803264">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and manufacturing practices for performability engineeringent://SD_ILS/0/SD_ILS:6001022026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Chaturvedi, Sanjay K., editor. Gargama, Heeralal, editor. Rai, Rajiv N., editor.<br/>Yer Numarası TS171 .D47 2025<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394345731</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability analysis of modern power systemsent://SD_ILS/0/SD_ILS:5990182026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Saket, R. K., editor. Sanjeevikumar, Padmanaban, 1978-<br/>Yer Numarası TA169 .S234 2024<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computational intelligence in sustainable reliability engineeringent://SD_ILS/0/SD_ILS:5982722026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Malik, S. C., editor.<br/>Yer Numarası TA169 .C65 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865421</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability analysis using MINITAB and Pythonent://SD_ILS/0/SD_ILS:5978242026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Hwang, Jaejin, author.<br/>Yer Numarası TA169 .H93 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394329700</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Repairable systems reliability analysis : a comprehensive frameworkent://SD_ILS/0/SD_ILS:5963282026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Rai, Rajiv Nandan, author. Chaturvedi, Sanjay K., author. Bolia, Nomesh, author.<br/>Yer Numarası QA402 .R35 2020<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119526582</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessmentent://SD_ILS/0/SD_ILS:5937282026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.<br/>Yer Numarası TA169.5<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Fundamentals of reliability engineering : applications in multistage interconnection networksent://SD_ILS/0/SD_ILS:3420102026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Gunawan, Indra.<br/>Yer Numarası ONLINE(342010.1)<br/>Elektronik Erişim Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63558">http://www.books24x7.com/marc.asp?bookid=63558</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9781118914410">http://dx.doi.org/10.1002/9781118914410</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability engineering and risk analysis : a practical guideent://SD_ILS/0/SD_ILS:3638772026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Modarres, M. (Mohammad) Kaminskiy, Mark, 1946- Krivtsov, Vasiliy, 1963-<br/>Yer Numarası TA169 M627 2010<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Practical reliability engineering and analysis for system design and life-cycle sustainmentent://SD_ILS/0/SD_ILS:5471962026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Wessels, William R., author.<br/>Yer Numarası TS173 .W45 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420094404">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Human reliability assessment : theory and practiceent://SD_ILS/0/SD_ILS:5400462026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Spurgin, Anthony J., author.<br/>Yer Numarası TA166 .S685 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420068528">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated testing and validation testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:2541842026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Porter, Alex.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and analysis of accelerated tests for mission critical reliabilityent://SD_ILS/0/SD_ILS:5462542026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.<br/>Yer Numarası TA169.3 .L88 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Risk analysis in engineering and economicsent://SD_ILS/0/SD_ILS:5392592026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Ayyub, Bilal M., author.<br/>Yer Numarası T174.5 .A98 2003<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135438999">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Medical device reliability and associated areasent://SD_ILS/0/SD_ILS:5409122026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Dhillon, B. S. (Balbir S.), 1947, author.<br/>Yer Numarası R855.3 .D47 2000<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420042238">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Design reliability : fundamentals and applicationsent://SD_ILS/0/SD_ILS:5405722026-01-22T11:00:31Z2026-01-22T11:00:31ZYazar Dhillon, B. S. (Balbir S.), 1947-<br/>Yer Numarası TA174 .D4929 1999<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a>
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