Arama Sonu&ccedil;lar&#305; Data processing - Daralt&#305;lm&#305;&#351;: 1973 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dData$002bprocessing$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025091973$0025091973$0026ic$003dtrue$0026ps$003d300?dt=list 2024-11-27T10:49:26Z Computer data processing ent://SD_ILS/0/SD_ILS:34647 2024-11-27T10:49:26Z 2024-11-27T10:49:26Z Yazar&#160;Davis, Gordon Bitter.<br/>Yer Numaras&#305;&#160;QA 76.5 D28 1981<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Networking and other forms of cooperation : papers presented at the 1973 Clinic on. April 29-May 2, 1973 ent://SD_ILS/0/SD_ILS:48875 2024-11-27T10:49:26Z 2024-11-27T10:49:26Z Yazar&#160;Clinic on Library Applications of Data Processing (10th : 1973 : Champaign, ILL.).&#160;Lancaster, F. Wilfrid., ed.<br/>Yer Numaras&#305;&#160;Z 678.9.A1 C5 1973 N<br/>Format:&#160;Kitap<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~1<br/> Advanced technology libraries. ent://SD_ILS/0/SD_ILS:228158 2024-11-27T10:49:26Z 2024-11-27T10:49:26Z Yer Numaras&#305;&#160;ALFABET&#304;K V.4 1975<br/>Format:&#160;Devam Eden S&uuml;reli Yay&#305;nlar&#160;Di&#287;er<br/>Durum&#160;Beytepe K&uuml;t&uuml;phanesi~3&#160;~0<br/> STRESS, a user's manual a problem-oriented computer language for structural engineering ent://SD_ILS/0/SD_ILS:220266 2024-11-27T10:49:26Z 2024-11-27T10:49:26Z Yazar&#160;Massachusetts Institute of Technology. Department of Civil Engineering.&#160;Fenves, Steven J. (Steven Joseph)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276886">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276886</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Sparse matrices ent://SD_ILS/0/SD_ILS:256728 2024-11-27T10:49:26Z 2024-11-27T10:49:26Z Yazar&#160;Tewarson, Reginald P.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780126856507">http://www.sciencedirect.com/science/book/9780126856507</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computed electron micrographs and defect identification ent://SD_ILS/0/SD_ILS:256160 2024-11-27T10:49:26Z 2024-11-27T10:49:26Z Yazar&#160;Head, A. K.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780720417579">http://www.sciencedirect.com/science/book/9780720417579</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>