Arama Sonu&ccedil;lar&#305; Diffraction patterns. - Daralt&#305;lm&#305;&#351;: &Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dDiffraction$002bpatterns.$0026qf$003dLIBRARY$002509K$0025C3$0025BCt$0025C3$0025BCphane$0025091$00253AONLINE$002509$0025C3$002587evrimi$0025C3$0025A7i$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026pe$003dd$00253A$0026ps$003d300?dt=list 2025-01-01T08:38:38Z Self-similarity in Walsh Functions and in the Farfield Diffraction Patterns of Radial Walsh Filters ent://SD_ILS/0/SD_ILS:402359 2025-01-01T08:38:38Z 2025-01-01T08:38:38Z Yazar&#160;Hazra, Lakshminarayan. author.&#160;Mukherjee, Pubali. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-981-10-2809-0">https://doi.org/10.1007/978-981-10-2809-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Fringe pattern analysis for optical metrology : theory, algorithms, and applications ent://SD_ILS/0/SD_ILS:342225 2025-01-01T08:38:38Z 2025-01-01T08:38:38Z Yazar&#160;Serv&iacute;n, Manuel, author.&#160;Quiroga, J. Antonio (Juan Antonio), author.&#160;Padilla, J. Mois&eacute;s (Jos&eacute; Mois&eacute;s), author.<br/>Yer Numaras&#305;&#160;ONLINE(342225.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414">http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414</a> ebrary <a href="http://site.ebrary.com/id/10881255">http://site.ebrary.com/id/10881255</a> John Wiley <a href="http://dx.doi.org/10.1002/9783527681075">http://dx.doi.org/10.1002/9783527681075</a> MyiLibrary <a href="http://www.myilibrary.com?id=615339">http://www.myilibrary.com?id=615339</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computational modelling of objects represented in images fundamentals, methods and applications III : proceedings of the International Symposium Compimage 2012, Rome, Italy, 5-7 September 2012 ent://SD_ILS/0/SD_ILS:285447 2025-01-01T08:38:38Z 2025-01-01T08:38:38Z Yazar&#160;CompIMAGE 2012 (2012 : Rome, Italy)&#160;Di Giamberardino, Paolo.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9780203075371">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Interferogram analysis for optical testing ent://SD_ILS/0/SD_ILS:288501 2025-01-01T08:38:38Z 2025-01-01T08:38:38Z Yazar&#160;Malacara, Daniel, 1937-&#160;Servn&#789;, Manuel.&#160;Malacara, Zacarias, 1948-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420027273">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>