Arama Sonu&ccedil;lar&#305; Diffraction. - Daralt&#305;lm&#305;&#351;: Optical measurements. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dDiffraction.$0026qf$003dSUBJECT$002509Konu$002509Optical$002bmeasurements.$002509Optical$002bmeasurements.$0026ps$003d300?dt=list 2024-11-22T21:24:37Z Fringe pattern analysis for optical metrology : theory, algorithms, and applications ent://SD_ILS/0/SD_ILS:342225 2024-11-22T21:24:37Z 2024-11-22T21:24:37Z Yazar&#160;Serv&iacute;n, Manuel, author.&#160;Quiroga, J. Antonio (Juan Antonio), author.&#160;Padilla, J. Mois&eacute;s (Jos&eacute; Mois&eacute;s), author.<br/>Yer Numaras&#305;&#160;ONLINE(342225.1)<br/>Elektronik Eri&#351;im&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414">http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414</a> ebrary <a href="http://site.ebrary.com/id/10881255">http://site.ebrary.com/id/10881255</a> John Wiley <a href="http://dx.doi.org/10.1002/9783527681075">http://dx.doi.org/10.1002/9783527681075</a> MyiLibrary <a href="http://www.myilibrary.com?id=615339">http://www.myilibrary.com?id=615339</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Interferogram analysis for optical testing ent://SD_ILS/0/SD_ILS:288501 2024-11-22T21:24:37Z 2024-11-22T21:24:37Z Yazar&#160;Malacara, Daniel, 1937-&#160;Servn&#789;, Manuel.&#160;Malacara, Zacarias, 1948-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781420027273">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>