Arama Sonuçları Digital integrated circuits -- Testing.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dDigital$002bintegrated$002bcircuits$002b--$002bTesting.$0026ps$003d300?dt=list
2026-01-14T06:04:49Z
Digital design and fabrication
ent://SD_ILS/0/SD_ILS:540504
2026-01-14T06:04:49Z
2026-01-14T06:04:49Z
Yazar Oklobdzija, Vojin G.<br/>Yer Numarası TK7885 .D54 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315222226">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Digital integrated circuits : design-for-test using Simulink and Stateflow
ent://SD_ILS/0/SD_ILS:109724
2026-01-14T06:04:49Z
2026-01-14T06:04:49Z
Yazar Perelroyzen, Evgeni.<br/>Yer Numarası TK7874 .P445 2007<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>
The VLSI handbook
ent://SD_ILS/0/SD_ILS:547504
2026-01-14T06:04:49Z
2026-01-14T06:04:49Z
Yazar Chen, Wai-Kai, 1936-<br/>Yer Numarası TK7874.75 .V573 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420005967">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Microelectronics
ent://SD_ILS/0/SD_ILS:547489
2026-01-14T06:04:49Z
2026-01-14T06:04:49Z
Yazar Whitaker, Jerry C.<br/>Yer Numarası TK7874 .M4587 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420037593">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Computer Engineering Handbook.
ent://SD_ILS/0/SD_ILS:543838
2026-01-14T06:04:49Z
2026-01-14T06:04:49Z
Yazar Oklobdzija, Vojin G., author. CRC Press LLC.<br/>Yer Numarası TK7885 .C645 2002<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420041545">https://www.taylorfrancis.com/books/9781420041545</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
ent://SD_ILS/0/SD_ILS:392732
2026-01-14T06:04:49Z
2026-01-14T06:04:49Z
Yazar Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-<br/>Yer Numarası TK7874.75 B87 2000<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>
Digital circuit testing a guide to DFT and other techniques
ent://SD_ILS/0/SD_ILS:255234
2026-01-14T06:04:49Z
2026-01-14T06:04:49Z
Yazar Wang, Francis C.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127345802">http://www.sciencedirect.com/science/book/9780127345802</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Digital systems testing and testable design
ent://SD_ILS/0/SD_ILS:249585
2026-01-14T06:04:49Z
2026-01-14T06:04:49Z
Yazar Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>