Arama Sonuçları Digital integrated circuits -- Testing.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dDigital$002bintegrated$002bcircuits$002b--$002bTesting.$0026ps$003d300?2024-11-13T17:07:23ZThe VLSI handbookent://SD_ILS/0/SD_ILS:2893312024-11-13T17:07:23Z2024-11-13T17:07:23ZYazar Chen, Wai-Kai, 1936-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420005967">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Digital integrated circuits : design-for-test using Simulink and Stateflowent://SD_ILS/0/SD_ILS:1097242024-11-13T17:07:23Z2024-11-13T17:07:23ZYazar Perelroyzen, Evgeni.<br/>Yer Numarası TK7874 .P445 2007<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuitsent://SD_ILS/0/SD_ILS:3927322024-11-13T17:07:23Z2024-11-13T17:07:23ZYazar Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-<br/>Yer Numarası TK7874.75 B87 2000<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Digital circuit testing a guide to DFT and other techniquesent://SD_ILS/0/SD_ILS:2552342024-11-13T17:07:23Z2024-11-13T17:07:23ZYazar Wang, Francis C.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127345802">http://www.sciencedirect.com/science/book/9780127345802</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Digital systems testing and testable designent://SD_ILS/0/SD_ILS:2495852024-11-13T17:07:23Z2024-11-13T17:07:23ZYazar Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>