Arama Sonu&ccedil;lar&#305; Dynamic testing -- Congresses. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dDynamic$002btesting$002b--$002bCongresses.$0026ic$003dtrue$0026ps$003d300?dt=list 2026-01-14T06:40:20Z Dynamic environments testing. Volume 7 ent://SD_ILS/0/SD_ILS:566035 2026-01-14T06:40:20Z 2026-01-14T06:40:20Z Yazar&#160;International Modal Analysis Conference (41st : 2023)&#160;Harvie, Julie M., editor.<br/>Yer Numaras&#305;&#160;TA352 .I58 2024 EB<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9788743804130">https://www.taylorfrancis.com/books/9788743804130</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Dynamic environments testing. Vol. 7 ent://SD_ILS/0/SD_ILS:568954 2026-01-14T06:40:20Z 2026-01-14T06:40:20Z Yazar&#160;International Modal Analysis Conference (42nd : 2024)&#160;Schoenherr, Tyler, editor.&#160;Karlicek, Alexandra, editor.&#160;Beale, Dagny, editor.<br/>Yer Numaras&#305;&#160;TA352 .I58 2024 EB<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9788743804284">https://www.taylorfrancis.com/books/9788743804284</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>