Arama Sonuçları Educational tests and measurements - Daraltılmış: Psychometrics.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dEducational$002btests$002band$002bmeasurements$0026qf$003dSUBJECT$002509Konu$002509Psychometrics.$002509Psychometrics.$0026ps$003d300?2024-12-01T18:01:13ZEğitimde ve psikolojide ölçme : klasik test teorisi ve uygulamasıent://SD_ILS/0/SD_ILS:3804392024-12-01T18:01:13Z2024-12-01T18:01:13ZYazar Baykul, Yaşar.<br/>Yer Numarası LB3051 B39 2015<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Looking Back Proceedings of a Conference in Honor of Paul W. Hollandent://SD_ILS/0/SD_ILS:1731972024-12-01T18:01:13Z2024-12-01T18:01:13ZYazar Dorans, Neil J. editor. Sinharay, Sandip. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9389-2">http://dx.doi.org/10.1007/978-1-4419-9389-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical Modeling of the National Assessment of Educational Progressent://SD_ILS/0/SD_ILS:1733502024-12-01T18:01:13Z2024-12-01T18:01:13ZYazar Aitkin, Irit. author. Aitkin, Murray. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9937-5">http://dx.doi.org/10.1007/978-1-4419-9937-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Elements of Adaptive Testingent://SD_ILS/0/SD_ILS:1677682024-12-01T18:01:13Z2024-12-01T18:01:13ZYazar van der Linden, Wim J. editor. Glas, Cees A.W. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-85461-8">http://dx.doi.org/10.1007/978-0-387-85461-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Innovative Assessment for the 21st Century Supporting Educational Needsent://SD_ILS/0/SD_ILS:1726212024-12-01T18:01:13Z2024-12-01T18:01:13ZYazar Shute, Valerie J. editor. Becker, Betsy Jane. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-6530-1">http://dx.doi.org/10.1007/978-1-4419-6530-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliabilityent://SD_ILS/0/SD_ILS:2334272024-12-01T18:01:13Z2024-12-01T18:01:13ZYazar Meyer, J. Patrick.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780195380361.001.0001</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical test theory for the behavioral sciencesent://SD_ILS/0/SD_ILS:2908792024-12-01T18:01:13Z2024-12-01T18:01:13ZYazar Gruijter, Dato N. de. Kamp, Leo J. Th. van der.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781584889595">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Selected Papers of Frederick Mostellerent://SD_ILS/0/SD_ILS:1663022024-12-01T18:01:13Z2024-12-01T18:01:13ZYazar Fienberg, Stephen E. editor. Hoaglin, David C. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-44956-2">http://dx.doi.org/10.1007/978-0-387-44956-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Linear Models for Optimal Test Designent://SD_ILS/0/SD_ILS:1655992024-12-01T18:01:13Z2024-12-01T18:01:13ZYazar Linden, Wim J. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-29054-0">http://dx.doi.org/10.1007/0-387-29054-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Eğitimde ve psikolojide ölçme : klasik test teorisi ve uygulamasıent://SD_ILS/0/SD_ILS:5170282024-12-01T18:01:13Z2024-12-01T18:01:13ZYazar Baykul, Yaşar.<br/>Yer Numarası LB3051 B39 2000<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Introduction to classical and modern test theoryent://SD_ILS/0/SD_ILS:1122772024-12-01T18:01:13Z2024-12-01T18:01:13ZYazar Crocker, Linda. Algina, James.<br/>Yer Numarası BF39 .C695 1986<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>