Arama Sonuçları Electron Microscopy. - Daraltılmış: Amelinckx, S. (Severin)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dElectron$002bMicroscopy.$0026qf$003dAUTHOR$002509Yazar$002509Amelinckx$00252C$002bS.$002b$002528Severin$002529$002509Amelinckx$00252C$002bS.$002b$002528Severin$002529$0026ps$003d300?2024-11-11T04:05:23ZElectron microscopy principles and fundamentalsent://SD_ILS/0/SD_ILS:3007142024-11-11T04:05:23Z2024-11-11T04:05:23ZYazar Amelinckx, S. (Severin) Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9783527614561">http://dx.doi.org/10.1002/9783527614561</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Diffraction and imaging techniques in material scienceent://SD_ILS/0/SD_ILS:2561522024-11-11T04:05:23Z2024-11-11T04:05:23ZYazar Amelinckx, S. (Severin) Gevers, R. Landuyt, J. van. International Summer Course on Material Science (1969 : Antwerp, Belgium). Modern diffraction and imaging techniques in material science.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444851284">Vol. I</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444851291">Vol. II</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>