Arama Sonuçları Electron Microscopy. - Daraltılmış: Chemistry.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dElectron$002bMicroscopy.$0026qf$003dSUBJECT$002509Konu$002509Chemistry.$002509Chemistry.$0026ps$003d300?2024-09-21T14:23:15ZModeling Nanoscale Imaging in Electron Microscopyent://SD_ILS/0/SD_ILS:1741182024-09-21T14:23:15Z2024-09-21T14:23:15ZYazar Vogt, Thomas. editor. Dahmen, Wolfgang. editor. Binev, Peter. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-2191-7">http://dx.doi.org/10.1007/978-1-4614-2191-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transmission Electron Microscopy and Diffractometry of Materialsent://SD_ILS/0/SD_ILS:1869972024-09-21T14:23:15Z2024-09-21T14:23:15ZYazar Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEMent://SD_ILS/0/SD_ILS:1652202024-09-21T14:23:15Z2024-09-21T14:23:15ZYazar Egerton, Ray F. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>