Arama Sonu&ccedil;lar&#305; Electron microscopy -- Data processing. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dElectron$002bmicroscopy$002b--$002bData$002bprocessing.$0026ic$003dtrue$0026ps$003d300?dt=list 2026-01-13T05:58:36Z Scanning transmission electron microscopy : advanced characterization methods for materials science applications ent://SD_ILS/0/SD_ILS:565126 2026-01-13T05:58:36Z 2026-01-13T05:58:36Z Yazar&#160;Bruma, Alina, editor.<br/>Yer Numaras&#305;&#160;QH212 .S34 S33 2021<br/>Elektronik Eri&#351;im&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429243011">https://www.taylorfrancis.com/books/9780429243011</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Computed electron micrographs and defect identification ent://SD_ILS/0/SD_ILS:256160 2026-01-13T05:58:36Z 2026-01-13T05:58:36Z Yazar&#160;Head, A. K.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780720417579">http://www.sciencedirect.com/science/book/9780720417579</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>