Arama Sonuçları Electron microscopy. - Daraltılmış: Surfaces (Physics).SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dElectron$002bmicroscopy.$0026qf$003dSUBJECT$002509Konu$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026ic$003dtrue$0026ps$003d300?2024-11-11T00:31:09ZModeling Nanoscale Imaging in Electron Microscopyent://SD_ILS/0/SD_ILS:1741182024-11-11T00:31:09Z2024-11-11T00:31:09ZYazar Vogt, Thomas. editor. Dahmen, Wolfgang. editor. Binev, Peter. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-2191-7">http://dx.doi.org/10.1007/978-1-4614-2191-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transmission Electron Microscopy and Diffractometry of Materialsent://SD_ILS/0/SD_ILS:3332652024-11-11T00:31:09Z2024-11-11T00:31:09ZYazar Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333265.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-29761-8">http://dx.doi.org/10.1007/978-3-642-29761-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Scanning Transmission Electron Microscopy Imaging and Analysisent://SD_ILS/0/SD_ILS:1728022024-11-11T00:31:09Z2024-11-11T00:31:09ZYazar Pennycook, Stephen J. editor. Nellist, Peter D. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-7200-2">http://dx.doi.org/10.1007/978-1-4419-7200-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>New Horizons of Applied Scanning Electron Microscopyent://SD_ILS/0/SD_ILS:1905372024-11-11T00:31:09Z2024-11-11T00:31:09ZYazar Shimizu, Kenichi. author. Mitani, Tomoaki. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03160-1">http://dx.doi.org/10.1007/978-3-642-03160-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transmission Electron Microscopy and Diffractometry of Materialsent://SD_ILS/0/SD_ILS:1869972024-11-11T00:31:09Z2024-11-11T00:31:09ZYazar Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>In Situ Transmission Electron Microscopy Studies of Carbon Nanotube Nucleation Mechanism and Carbon Nanotube-Clamped Metal Atomic Chainsent://SD_ILS/0/SD_ILS:3343952024-11-11T00:31:09Z2024-11-11T00:31:09ZYazar Tang, Dai-Ming. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(334395.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-37259-9">http://dx.doi.org/10.1007/978-3-642-37259-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Sample Preparation Handbook for Transmission Electron Microscopy Techniquesent://SD_ILS/0/SD_ILS:1724752024-11-11T00:31:09Z2024-11-11T00:31:09ZYazar Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-5975-1">http://dx.doi.org/10.1007/978-1-4419-5975-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Sample Preparation Handbook for Transmission Electron Microscopy Methodologyent://SD_ILS/0/SD_ILS:1680962024-11-11T00:31:09Z2024-11-11T00:31:09ZYazar Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-98182-6">http://dx.doi.org/10.1007/978-0-387-98182-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysisent://SD_ILS/0/SD_ILS:1677902024-11-11T00:31:09Z2024-11-11T00:31:09ZYazar Echlin, Patrick. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-85731-2">http://dx.doi.org/10.1007/978-0-387-85731-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transmission Electron Microscopy A Textbook for Materials Scienceent://SD_ILS/0/SD_ILS:1673512024-11-11T00:31:09Z2024-11-11T00:31:09ZYazar Williams, David B. author. Carter, C. Barry. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-387-76501-3">http://dx.doi.org/10.1007/978-0-387-76501-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEMent://SD_ILS/0/SD_ILS:1652202024-11-11T00:31:09Z2024-11-11T00:31:09ZYazar Egerton, Ray F. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>