Arama Sonu&ccedil;lar&#305; Electronic books. - Daralt&#305;lm&#305;&#351;: Software engineering. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dElectronic$002bbooks.$0026qf$003dSUBJECT$002509Konu$002509Software$002bengineering.$002509Software$002bengineering.$0026ps$003d300$0026isd$003dtrue?dt=list 2024-11-25T06:03:16Z Simple statistical methods for software engineering : data and patterns ent://SD_ILS/0/SD_ILS:380133 2024-11-25T06:03:16Z 2024-11-25T06:03:16Z Yazar&#160;Pandian, C. Ravindranath, author.&#160;Kumar S. K., Murali, author.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439816622">Distributed by publisher. 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E. (Richard E.), 1937-&#160;IEEE Computer Society.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381789">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Systems and software engineering with applications ent://SD_ILS/0/SD_ILS:249813 2024-11-25T06:03:16Z 2024-11-25T06:03:16Z Yazar&#160;Schneidewind, Norman.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539</a> IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Practical support for lean six sigma software process definition using IEEE software engineering standards ent://SD_ILS/0/SD_ILS:249325 2024-11-25T06:03:16Z 2024-11-25T06:03:16Z Yazar&#160;Land, Susan K.&#160;Smith, Douglas Burr, 1943-&#160;Walz, John W.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129687">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129687</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Dependability benchmarking for computer systems ent://SD_ILS/0/SD_ILS:249772 2024-11-25T06:03:16Z 2024-11-25T06:03:16Z Yazar&#160;Kanoun, Karama.&#160;Spainhower, Lisa.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Software measurement and estimation a practical approach ent://SD_ILS/0/SD_ILS:249472 2024-11-25T06:03:16Z 2024-11-25T06:03:16Z Yazar&#160;Laird, Linda M., 1952-&#160;Brennan, M. Carol, 1954-&#160;IEEE Computer Society.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> The cognitive dynamics of computer science cost-effective large scale software development ent://SD_ILS/0/SD_ILS:249473 2024-11-25T06:03:16Z 2024-11-25T06:03:16Z Yazar&#160;De Gyurky, Szabolcs Michael.&#160;Tarbell, Mark A.&#160;John Wiley &amp; Sons.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5201429">http://ieeexplore.ieee.org/servlet/opac?bknumber=5201429</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> IEEE Computer Society real-world software engineering problems a self-study guide for today's software professional ent://SD_ILS/0/SD_ILS:249830 2024-11-25T06:03:16Z 2024-11-25T06:03:16Z Yazar&#160;Naveda, J. Fernando.&#160;Seidman, Stephen B.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5989366">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5989366</a> IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5989366">http://ieeexplore.ieee.org/servlet/opac?bknumber=5989366</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Trustworthy systems through quantitative software engineering ent://SD_ILS/0/SD_ILS:249437 2024-11-25T06:03:16Z 2024-11-25T06:03:16Z Yazar&#160;Bernstein, Lawrence, 1940-&#160;Yuhas, C. M.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>