Arama Sonuçları Electronic circuits -- Testing.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dElectronic$002bcircuits$002b--$002bTesting.$0026ps$003d300?dt=list
2024-11-23T13:50:02Z
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
ent://SD_ILS/0/SD_ILS:392732
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Yazar Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-<br/>Yer Numarası TK7874.75 B87 2000<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>
Applied formal verification
ent://SD_ILS/0/SD_ILS:293531
2024-11-23T13:50:02Z
2024-11-23T13:50:02Z
Yazar Perry, Douglas L. Foster, Harry, 1956-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/applied-formal-verification">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Advances in electronic testing : challenges and methodologies
ent://SD_ILS/0/SD_ILS:119712
2024-11-23T13:50:02Z
2024-11-23T13:50:02Z
Yazar Gizopoulos, Dimitris.<br/>Yer Numarası TK7867 .A385 2006<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>
Algorithmic and Knowledge-based CAD for VLSI
ent://SD_ILS/0/SD_ILS:247743
2024-11-23T13:50:02Z
2024-11-23T13:50:02Z
Yazar Taylor, Gaynor, ed. Russell, Gordon, ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBCS004E">http://dx.doi.org/10.1049/PBCS004E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Analogue-digital ASICs Circuit techniques, design tools and applications
ent://SD_ILS/0/SD_ILS:247742
2024-11-23T13:50:02Z
2024-11-23T13:50:02Z
Yazar Soin, R. S., ed. Maloberti, F., ed. Franca, J., ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBCS003E">http://dx.doi.org/10.1049/PBCS003E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>