Arama Sonuçları Electronic circuits--Testing. - Daraltılmış: Beytepe Genel KoleksiyonSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dElectronic$002bcircuits--Testing.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253ABEYTEPEGEN$002509Beytepe$002bGenel$002bKoleksiyon$002509$0026ps$003d300?dt=list2025-12-08T13:05:14ZEssentials of electronic testing for digital, memory, and mixed-signal VLSI circuitsent://SD_ILS/0/SD_ILS:3927322025-12-08T13:05:14Z2025-12-08T13:05:14ZYazar Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-<br/>Yer Numarası TK7874.75 B87 2000<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Advances in electronic testing : challenges and methodologiesent://SD_ILS/0/SD_ILS:1197122025-12-08T13:05:14Z2025-12-08T13:05:14ZYazar Gizopoulos, Dimitris.<br/>Yer Numarası TK7867 .A385 2006<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>