Arama Sonuçları Electronics. - Daraltılmış: Electromagnetic interference.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dElectronics.$0026qf$003dSUBJECT$002509Konu$002509Electromagnetic$002binterference.$002509Electromagnetic$002binterference.$0026ps$003d300?dt=list2024-11-25T04:35:15ZThe fields of electronics understanding electronics using basic physicsent://SD_ILS/0/SD_ILS:3014952024-11-25T04:35:15Z2024-11-25T04:35:15ZYazar Morrison, Ralph. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471433934">http://dx.doi.org/10.1002/0471433934</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>EMI filter designent://SD_ILS/0/SD_ILS:2855832024-11-25T04:35:15Z2024-11-25T04:35:15ZYazar Ozenbaugh, Richard Lee.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9780203910313">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transceiver and System Design for Digital Communicationsent://SD_ILS/0/SD_ILS:3649222024-11-25T04:35:15Z2024-11-25T04:35:15ZYazar Bullock, Scott R.<br/>Yer Numarası \(364922.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/SBCS504E">http://dx.doi.org/10.1049/SBCS504E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>RF analog impairments modeling for communication systems simulation application to OFDM-based transceiversent://SD_ILS/0/SD_ILS:3052052024-11-25T04:35:15Z2024-11-25T04:35:15ZYazar Smaini, Lydi, 1974-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://lib.myilibrary.com?id=395765">Connect to MyiLibrary resource.</a>
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Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=49728">http://www.books24x7.com/marc.asp?bookid=49728</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electronic Warfare Pocket Guideent://SD_ILS/0/SD_ILS:2480342024-11-25T04:35:15Z2024-11-25T04:35:15ZYazar Adamy, David L.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/SBRA006E">http://dx.doi.org/10.1049/SBRA006E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transceiver and System Design for Digital Communicationsent://SD_ILS/0/SD_ILS:2480572024-11-25T04:35:15Z2024-11-25T04:35:15ZYazar Bullock, Scott R.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/SBTE008E">http://dx.doi.org/10.1049/SBTE008E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Signal integrity and radiated emissions of high-speed digital systemsent://SD_ILS/0/SD_ILS:3028012024-11-25T04:35:15Z2024-11-25T04:35:15ZYazar Caniggia, Spartaco. Maradei, Francescaromana.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470772874">An electronic book accessible through the World Wide Web; click for information</a>
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Volltext <a href="http://proquest.tech.safaribooksonline.de/9780470511664">http://proquest.tech.safaribooksonline.de/9780470511664</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Testing for EMC compliance approaches and techniquesent://SD_ILS/0/SD_ILS:2494062024-11-25T04:35:15Z2024-11-25T04:35:15ZYazar Montrose, Mark I. Nakauchi, Edward M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237008">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237008</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>