Arama Sonuçları Ellipsometry. - Daraltılmış: Electronic Library
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dEllipsometry.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026ic$003dtrue$0026ps$003d300?
2026-03-07T05:43:16Z
Handbook of ellipsometry
ent://SD_ILS/0/SD_ILS:252064
2026-03-07T05:43:16Z
2026-03-07T05:43:16Z
Yazar Tompkins, Harland G. Irene, Eugene A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815514992">http://www.sciencedirect.com/science/book/9780815514992</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Ellipsometry at the Nanoscale
ent://SD_ILS/0/SD_ILS:333782
2026-03-07T05:43:16Z
2026-03-07T05:43:16Z
Yazar Losurdo, Maria. editor. Hingerl, Kurt. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333782.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-33956-1">http://dx.doi.org/10.1007/978-3-642-33956-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Spectroscopic ellipsometry principles and applications
ent://SD_ILS/0/SD_ILS:296817
2026-03-07T05:43:16Z
2026-03-07T05:43:16Z
Yazar Fujiwara, Hiroyuki. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470060193">http://dx.doi.org/10.1002/9780470060193</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
A user's guide to ellipsometry
ent://SD_ILS/0/SD_ILS:257949
2026-03-07T05:43:16Z
2026-03-07T05:43:16Z
Yazar Tompkins, Harland G.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780126939507">http://www.sciencedirect.com/science/book/9780126939507</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Ellipsometry of Functional Organic Surfaces and Films
ent://SD_ILS/0/SD_ILS:530874
2026-03-07T05:43:16Z
2026-03-07T05:43:16Z
Yazar Hinrichs, Karsten. editor. Eichhorn, Klaus-Jochen. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-40128-2">https://doi.org/10.1007/978-3-642-40128-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons
ent://SD_ILS/0/SD_ILS:184793
2026-03-07T05:43:16Z
2026-03-07T05:43:16Z
Yazar Schubert, Mathias. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/b11964">http://dx.doi.org/10.1007/b11964</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>