Arama Sonuçları Embedded computer systems -- Testing.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dEmbedded$002bcomputer$002bsystems$002b--$002bTesting.$0026te$003dILS$0026ps$003d300?dt=list
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Embedded software system testing : automatic testing solution based on formal method
ent://SD_ILS/0/SD_ILS:575375
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Yazar Yin, Yongfeng, 1978- author. Jiang, Bo, 1981- author. Su, Qingran, translator. Qiu, Ruinan, translator. Guo, Yang (Translator), translator.<br/>Yer Numarası TK7895 .E42<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003390923">https://www.taylorfrancis.com/books/9781003390923</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Electrical Engineering Handbook - Six Volume Set
ent://SD_ILS/0/SD_ILS:542484
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Yazar Dorf, Richard C., editor. Taylor and Francis.<br/>Yer Numarası R857 .B54<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Testing Complex and Embedded Systems
ent://SD_ILS/0/SD_ILS:546439
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Yazar Pries, Kim H., author. Quigley, Jon M., author. Taylor and Francis.<br/>Yer Numarası TK7895 .E42<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315169453">Click here to view</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Intelligent Software Methodologies, Tools and Techniques 14th International Conference, SoMet 2015, Naples, Italy, September 15-17, 2015. Proceedings
ent://SD_ILS/0/SD_ILS:518485
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Yazar Fujita, Hamido. editor. (orcid) Guizzi, Guido. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-22689-7">https://doi.org/10.1007/978-3-319-22689-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Model-based testing for embedded systems
ent://SD_ILS/0/SD_ILS:546466
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Yazar Zander, Justyna. Schieferdecker, Ina. Mosterman, Pieter J.<br/>Yer Numarası TK7895 .E42 M636 2011<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315218021">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Digital design and fabrication
ent://SD_ILS/0/SD_ILS:540504
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Yazar Oklobdzija, Vojin G.<br/>Yer Numarası TK7885 .D54 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315222226">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>