Arama Sonuçları Engineering -- Statistical methods - Daraltılmış: Electronics.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dEngineering$002b--$002bStatistical$002bmethods$0026qf$003dSUBJECT$002509Konu$002509Electronics.$002509Electronics.$0026ps$003d300?dt=list2026-06-14T20:29:58ZReliability prediction for microelectronicsent://SD_ILS/0/SD_ILS:5989682026-06-14T20:29:58Z2026-06-14T20:29:58ZYazar Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.<br/>Yer Numarası TK7874<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>State-Space Approaches for Modelling and Control in Financial Engineering Systems theory and machine learning methodsent://SD_ILS/0/SD_ILS:6125522026-06-14T20:29:58Z2026-06-14T20:29:58ZYazar Rigatos, Gerasimos G. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-52866-3">https://doi.org/10.1007/978-3-319-52866-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>