Arama Sonuçları Engineering -- Statistical methodsSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dEngineering$002b--$002bStatistical$002bmethods$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?2026-01-21T19:52:06ZStatistical methods for financial engineeringent://SD_ILS/0/SD_ILS:3712322026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Remillard, Bruno.<br/>Yer Numarası HG176.7 R46 2013<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Introduction to statistical methods in engineeringent://SD_ILS/0/SD_ILS:476462026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Gürpınar, Aybars.<br/>Yer Numarası TA 340 G96 1979 V.1<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Computational and statistical methods for chemical engineeringent://SD_ILS/0/SD_ILS:5606052026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Krijnen, Wim P., author. Wit, Ernst, author.<br/>Yer Numarası TP184<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003178194">https://www.taylorfrancis.com/books/9781003178194</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical methods in engineering and quality assuranceent://SD_ILS/0/SD_ILS:2952622026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar John, Peter William Meredith.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/21329921.html">http://catalog.hathitrust.org/api/volumes/oclc/21329921.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316825">http://dx.doi.org/10.1002/9780470316825</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Simple statistical methods for software engineering : data and patternsent://SD_ILS/0/SD_ILS:3801332026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Pandian, C. Ravindranath, author. Kumar S. K., Murali, author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439816622">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A first course in quality engineering : integrating statistical and management methods of qualityent://SD_ILS/0/SD_ILS:3652392026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Krishnamoorthi, K. S. Krishnamoorthi, V. Ram.<br/>Yer Numarası TS156.8 K75 2011<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>R programming for mass spectrometry : effective and reproducible data analysisent://SD_ILS/0/SD_ILS:5999002026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Julian, Randall K., author.<br/>Yer Numarası QD96 .M3 J85 2025<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872405">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119872405</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Engineering data analysis with MATLAB®ent://SD_ILS/0/SD_ILS:5763852026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Mustafy, Tanvir, author. Rahman, Tauhid, author. Siddiqui, Nafisa, author.<br/>Yer Numarası TA340<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003399582">https://www.taylorfrancis.com/books/9781003399582</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Model based monitoring and statistical controlent://SD_ILS/0/SD_ILS:5880802026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Ohtsu, Kohei, author. Kitagawa, G. (Genshiro), 1948- translator. O2 Memorial Project, translator.<br/>Yer Numarası VM159<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003428565">https://www.taylorfrancis.com/books/9781003428565</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability prediction for microelectronicsent://SD_ILS/0/SD_ILS:5989682026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.<br/>Yer Numarası TK7874<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Data analysis and related applications : new approaches. 4ent://SD_ILS/0/SD_ILS:5993852026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Dimotikalis, Yiannis, editor. Skiadas, Christos H., editor.<br/>Yer Numarası QA276 .D38 2024<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394316915">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394316915</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mathematical modeling and simulation : introduction for scientists and engineersent://SD_ILS/0/SD_ILS:5993002026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Velten, Kai, author. Schmidt, Dominik M., author. Kahlen, Katrin, author.<br/>Yer Numarası QA401 .V38 2024<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527849604">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527849604</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probability foundations for engineersent://SD_ILS/0/SD_ILS:5723732026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Nachlas, Joel A., author.<br/>Yer Numarası TA340<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003294382">https://www.taylorfrancis.com/books/9781003294382</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Modeling remaining useful life dynamics in reliability engineeringent://SD_ILS/0/SD_ILS:5791042026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Dersin, Pierre, author.<br/>Yer Numarası TS173<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003250685">https://www.taylorfrancis.com/books/9781003250685</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Clinical Applications of Artificial Intelligence in Real-World Dataent://SD_ILS/0/SD_ILS:5220262026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Asselbergs, Folkert W. editor. Denaxas, Spiros. editor. Oberski, Daniel L. editor. Moore, Jason H. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-36678-9">https://doi.org/10.1007/978-3-031-36678-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Nonparametric statistics with applications to science and engineering with Rent://SD_ILS/0/SD_ILS:5980112026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Kvam, Paul H., 1962- author. Vidakovic, Brani, 1955- author. Kim, Seong-joon, author.<br/>Yer Numarası QA278.8 .V53 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119268178">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119268178</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A guide to virology for engineers and applied scientists : epidemiology, emergency management, and optimizationent://SD_ILS/0/SD_ILS:5981152026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Reynolds, Megan M., author. Theodore, Louis, author.<br/>Yer Numarası QR360 .R49 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119853169">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119853169</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied reliability for industry. 1, Predictive reliability for the automobile, aeronautics, defense, medical, marine and space industriesent://SD_ILS/0/SD_ILS:5983062026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar El Hami, Abdelkhalak, editor. Delaux, David, editor. Grzeskowiak, Henri, editor.<br/>Yer Numarası TA169 .A67 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Geostatistics with data of different support applied to mining engineeringent://SD_ILS/0/SD_ILS:5119492026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Arcari Bassani, Marcel Antonio, author. Coimbra Leite Costa, João Felipe, author.<br/>Yer Numarası XX(511949.1)<br/>Elektronik Erişim EBSCOhost <a href="https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=2992173">https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=2992173</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability modelling with information measuresent://SD_ILS/0/SD_ILS:5627312026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Nair, N. Unnikrishnan, 1945- author. Sunoj, S. M., 1972- author. Rajesh, G., 1971- author.<br/>Yer Numarası TA169 .N3526 2022 EB<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003309635">https://www.taylorfrancis.com/books/9781003309635</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applied engineering statisticsent://SD_ILS/0/SD_ILS:5539202026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Rhinehart, R. Russell, 1946- author. Bethea, Robert M., author.<br/>Yer Numarası TA340<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003222330">https://www.taylorfrancis.com/books/9781003222330</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Experimental statistics and data analysis for mechanical and aerospace engineersent://SD_ILS/0/SD_ILS:5595162026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Middleton, James A., author.<br/>Yer Numarası TA340<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003094227">https://www.taylorfrancis.com/books/9781003094227</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical modeling of reliability structures and industrial processesent://SD_ILS/0/SD_ILS:5644312026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Triantafyllou, Ioannis S., editor. Ram, Mangey, editor.<br/>Yer Numarası TA169<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003203124">https://www.taylorfrancis.com/books/9781003203124</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Sterile processing of pharmaceutical products : engineering practice, validation, and compliance in regulated environmentsent://SD_ILS/0/SD_ILS:5973322026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Hout, Sam, author.<br/>Yer Numarası RS199 .S73<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119802358">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119802358</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design of experiments for reliability achievementent://SD_ILS/0/SD_ILS:5975612026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Rigdon, Steven E., 1955- author. Pan, Rong (Professor of reliability engineering), author. Montgomery, Douglas C., author. Freeman, Laura June, author.<br/>Yer Numarası TS173 .R54 2022<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Geostatistics for the mining industry : applications to porphyry copper depositsent://SD_ILS/0/SD_ILS:5075152026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Emery, Xavier, author. Séguret, Serge Antoine, author.<br/>Yer Numarası ONLİNE<br/>Elektronik Erişim <a href="https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2689733">https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=2689733</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Achieving Product Reliability : A Key to Business Success.ent://SD_ILS/0/SD_ILS:5634782026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Doganaksoy, Necip, 1960- author. Meeker, William Q., author. Hahn, Gerald J., author.<br/>Yer Numarası TS156<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003181361">https://www.taylorfrancis.com/books/9781003181361</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Stochastic models in reliability engineeringent://SD_ILS/0/SD_ILS:5545492026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Cui, Lirong, 1960- editor. Frenkel, Ilia, 1950- editor. Lisnianski, Anatoly, editor.<br/>Yer Numarası TA169 .S759 2020 EB<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429331527">https://www.taylorfrancis.com/books/9780429331527</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Geostatistics for the mining industry : applications to porphyry copper depositsent://SD_ILS/0/SD_ILS:5884972026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Emery, Xavier, author. Séguret, Serge Antoine, author.<br/>Yer Numarası TN444 .C5 E4413 2021<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003050469">https://www.taylorfrancis.com/books/9781003050469</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Industrial data analytics for diagnosis and prognosis : a random effects modelling approachent://SD_ILS/0/SD_ILS:5965742026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Zhou, Shiyu, 1970- author. Chen, Yong (Professor of industrial and systems engineering), author.<br/>Yer Numarası T57.35 .Z56 2021<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119666271">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119666271</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Introduction to statistical process controlent://SD_ILS/0/SD_ILS:5962792026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Aslam, Muhammad. Saghir, Aamir. Ahmad, Liaquat.<br/>Yer Numarası TS156.8<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119528425">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119528425</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical learning for big dependent dataent://SD_ILS/0/SD_ILS:5962962026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Peña, Daniel, 1948- author. Tsay, Ruey S., 1951- author.<br/>Yer Numarası QA76.9 .B45 P46 2021<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119417408">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119417408</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Structural reliability : approaches from perspectives of statistical momentsent://SD_ILS/0/SD_ILS:5963582026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Zhao, Yan-Gang, author. Lu, Zhao-Hui, author.<br/>Yer Numarası TA650 .Z53 2021<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620754">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119620754</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Modern industrial statistics : with applications in R, MINITAB and JMPent://SD_ILS/0/SD_ILS:5964712026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Kenett, Ron, author. Zacks, Shelemyahu, 1932- author. Amberti, Daniele, author.<br/>Yer Numarası TS156 .K46 2021<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertaintiesent://SD_ILS/0/SD_ILS:5965312026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Dahoo, Pierre Richard. Pougnet, Philippe. El Hami, Abdelkhalak.<br/>Yer Numarası QC88<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quantitative methods in transportationent://SD_ILS/0/SD_ILS:5516512026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Teodorović, D. (Dušan), 1951- author. Nikolić, Miloš, 1984- author.<br/>Yer Numarası TA1145 .T46 2020<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429286919">https://www.taylorfrancis.com/books/9780429286919</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Probability, statistics, and stochastic processes for engineers and scientistsent://SD_ILS/0/SD_ILS:5573712026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Haghighi, Aliakbar Montazer, author. Wickramasinghe, Indika Rathnathungalage, author.<br/>Yer Numarası TA340<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781351238403">https://www.taylorfrancis.com/books/9781351238403</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Designing engineering structures using stochastic optimization methodsent://SD_ILS/0/SD_ILS:5651332026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Aydin, Levent, editor. Artem, H. Seçil, editor. Oterkus, Selda, editor.<br/>Yer Numarası TA645 .D475 2020 EB<br/>Elektronik Erişim Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429289576">https://www.taylorfrancis.com/books/9780429289576</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Molecular simulations : fundamentals and practiceent://SD_ILS/0/SD_ILS:5960222026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Alavi, Saman.<br/>Yer Numarası QC28<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699452">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527699452</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Robust statistics : theory and methods (with R)ent://SD_ILS/0/SD_ILS:5947212026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Maronna, Ricardo A., author. Martin, R. Douglas, author. Yohai, Víctor J., author.<br/>Yer Numarası QA276 .M336 2019<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214656">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214656</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Model identification and data analysisent://SD_ILS/0/SD_ILS:5948512026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Bittanti, Sergio, author.<br/>Yer Numarası TA342 .B58 2019<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119546405">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119546405</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Bird strike in aviation : statistics, analysis and managementent://SD_ILS/0/SD_ILS:5951652026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar El-Sayed, Ahmed F., author.<br/>Yer Numarası TL553.5 .E37 2019<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119529835">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119529835</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical applications of Bayesian reliabilityent://SD_ILS/0/SD_ILS:5951732026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Liu, Yan, author. Abeyratne, Athula I., author.<br/>Yer Numarası QA279.5<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Joining of polymer-metal hybrid structures : principles and applicationsent://SD_ILS/0/SD_ILS:5941732026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Amancio Filho, Sergio T., 1976- editor. Blaga, Lucien-Attila, editor.<br/>Yer Numarası TA664 .J65 2018<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119429807">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119429807</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Analytic methods in systems and software testingent://SD_ILS/0/SD_ILS:5944822026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Kenett, Ron, editor. Ruggeri, Fabrizio, editor. Faltin, Frederick W., editor.<br/>Yer Numarası QA76.76 .T48 A52 2018 EB<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119357056</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The Bayesian way : introductory statistics for economists and engineersent://SD_ILS/0/SD_ILS:5943392026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Nyberg, Svein Olav, author.<br/>Yer Numarası QA279.5<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119246909">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119246909</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Introduction to Bayesian estimation and copula models of dependenceent://SD_ILS/0/SD_ILS:5934622026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Shemyakin, Arkady. Kniazev, Alexander (Mathematician)<br/>Yer Numarası QA279.5 .S435 2017 EB<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118959046">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118959046</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Introduction to quantitative data analysis in the behavioral and social sciencesent://SD_ILS/0/SD_ILS:5934702026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Albers, Michael J., editor<br/>Yer Numarası QA76.9 .Q36<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119290384">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119290384</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistics for process control engineers : a practical approachent://SD_ILS/0/SD_ILS:5935932026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar King, Myke, 1951-<br/>Yer Numarası TS156.8 .K487 2017<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119383536">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119383536</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>First hitting time regression models : lifetime data analysis based on underlying stochastic processesent://SD_ILS/0/SD_ILS:5938262026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Caroni, Chrysseis, author.<br/>Yer Numarası QA278.2<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119437260">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119437260</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Mühendisler ve fen bilimciler için olasılık ve istatistikent://SD_ILS/0/SD_ILS:4605942026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Walpole, Ronald E. Bakır, M. Akif.<br/>Yer Numarası TA540 M84 2016<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Semi-Markov processes : applications in system reliability and maintenanceent://SD_ILS/0/SD_ILS:3555172026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Grabski, Franciszek, author.<br/>Yer Numarası ONLINE(355517.1)<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780128005187">http://www.sciencedirect.com/science/book/9780128005187</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Project Management and Engineering Selected Papers from the 17th International AEIPRO Congress held in Logroño, Spain, in 2013ent://SD_ILS/0/SD_ILS:5295042026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Ayuso Muñoz, José Luis. editor. Yagüe Blanco, José Luis. editor. Capuz-Rizo, Salvador F. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-12754-5">https://doi.org/10.1007/978-3-319-12754-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>9th WCEAM Research Papers Volume 1 Proceedings of 2014 World Congress on Engineering Asset Managementent://SD_ILS/0/SD_ILS:5305292026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Amadi-Echendu, Joe. editor. Hoohlo, Changela. editor. Mathew, Joe. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-15536-4">https://doi.org/10.1007/978-3-319-15536-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of mathematics and statistics for the environmentent://SD_ILS/0/SD_ILS:3648712026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Spellman, Frank R., author. Whiting, Nancy E., author.<br/>Yer Numarası TD145 S676 2014<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Modern industrial statistics : with applications in R, MINITAB and JMPent://SD_ILS/0/SD_ILS:3417512026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Kenett, Ron. Amberti, Daniele, contributor. Zacks, Shelemyahu, 1932-<br/>Yer Numarası ONLINE(341751.1)<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118763667">http://dx.doi.org/10.1002/9781118763667</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Willful ignorance : the mismeasure of uncertaintyent://SD_ILS/0/SD_ILS:3418642026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Weisberg, Herbert I., 1944- author.<br/>Yer Numarası ONLINE(341864.1)<br/>Elektronik Erişim Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470890448.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470890448.jpg</a>
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<a href="http://rbdigital.oneclickdigital.com">http://rbdigital.oneclickdigital.com</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability analysis of dynamic systems efficient probabilistic methods and aerospace applicationsent://SD_ILS/0/SD_ILS:3065662026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Wu, Bin, author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124077119">http://www.sciencedirect.com/science/book/9780124077119</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Data analysis and statistics for geography, environmental science, and engineeringent://SD_ILS/0/SD_ILS:3712582026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Acevedo, Miguel F.<br/>Yer Numarası G70.2 A26 2013<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Methodology in robust and nonparametric statisticsent://SD_ILS/0/SD_ILS:5467682026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Jureckov, Jana, 1940, author. Sen, Pranab Kumar, 1937- Picek, Jan, 1965-<br/>Yer Numarası QA276 .J87 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439840696">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Probability & statistics for engineers & scientistsent://SD_ILS/0/SD_ILS:2683982026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Walpole, Ronald E.<br/>Yer Numarası TA340 P764 2012<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Monitoring and control of information-poor systemsent://SD_ILS/0/SD_ILS:3054972026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Dexter, A. L. (Arthur L.)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119945864">An electronic book accessible through the World Wide Web; click for information</a>
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OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical reliability engineeringent://SD_ILS/0/SD_ILS:2950992026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Gnedenko, B. V. (Boris Vladimirovich), 1912-1995. Pavlov, I. V. Ushakov, I. A. (Igorʹ Alekseevich) Chakravarty, Sumantra. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470172407">http://dx.doi.org/10.1002/9780470172407</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/98038904.html">http://catdir.loc.gov/catdir/bios/wiley042/98038904.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability modelling : A statistical approachent://SD_ILS/0/SD_ILS:781392026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Wolstenholme, Linda C.<br/>Yer Numarası TA 169 W65 1999<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Guidelines for improving plant reliability through data collection and analysisent://SD_ILS/0/SD_ILS:3000222026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar American Institute of Chemical Engineers. Center for Chemical Process Safety. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470935262">http://dx.doi.org/10.1002/9780470935262</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical methods for reliability dataent://SD_ILS/0/SD_ILS:850802026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Meeker, William Q. Escobar, Luis A., ort. yaz.<br/>Yer Numarası TS 173 M44 1998<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Elements of engineering probability and statisticsent://SD_ILS/0/SD_ILS:772102026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Ziemer, Rodger E.<br/>Yer Numarası TK 153 Z525 1997<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Statistical methods in water resourcesent://SD_ILS/0/SD_ILS:2558452026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Helsel, Dennis R. Hirsch, Robert M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444885289">http://www.sciencedirect.com/science/book/9780444885289</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>System reliability theory models and statistical methodsent://SD_ILS/0/SD_ILS:2952702026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Høyland, Arnljot, 1924- Rausand, Marvin.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469047</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316900">http://dx.doi.org/10.1002/9780470316900</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html">http://catdir.loc.gov/catdir/enhancements/fy0607/94010362-b.html</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/30072858.html">http://catalog.hathitrust.org/api/volumes/oclc/30072858.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical analysis for engineers and scientists : A computer-based approachent://SD_ILS/0/SD_ILS:834242026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Barnes, J. Wesley. Barnes, J. Wesley. Statistical analysis for engineers.<br/>Yer Numarası TA 340 B35 1994<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Reliability analysis and prediction a methodology oriented treatmentent://SD_ILS/0/SD_ILS:2552442026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Misra, Krishna B., 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444896063">http://www.sciencedirect.com/science/book/9780444896063</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated testing statistical models, test plans and data analysesent://SD_ILS/0/SD_ILS:2952592026-01-21T19:52:06Z2026-01-21T19:52:06ZYazar Nelson, Wayne, 1936-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a>
HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>