Arama Sonuçları Error. - Daraltılmış: 2012SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dError.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092012$0025092012$0026ps$003d300$0026isd$003dtrue?2024-11-15T12:29:52ZError Control for Network-on-Chip Linksent://SD_ILS/0/SD_ILS:1731782024-11-15T12:29:52Z2024-11-15T12:29:52ZYazar Fu, Bo. author. Ampadu, Paul. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9313-7">http://dx.doi.org/10.1007/978-1-4419-9313-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Immunity to Error through Misidentification New Essaysent://SD_ILS/0/SD_ILS:2353002024-11-15T12:29:52Z2024-11-15T12:29:52ZYazar Prosser, Simon. Recanati, François.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1017/CBO9781139043274">Access by subscription</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transient and Permanent Error Control for Networks-on-Chipent://SD_ILS/0/SD_ILS:1738192024-11-15T12:29:52Z2024-11-15T12:29:52ZYazar Yu, Qiaoyan. author. Ampadu, Paul. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0962-5">http://dx.doi.org/10.1007/978-1-4614-0962-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Determinants of Earnings Forecast Error, Earnings Forecast Revision and Earnings Forecast Accuracyent://SD_ILS/0/SD_ILS:2002032024-11-15T12:29:52Z2024-11-15T12:29:52ZYazar Gell, Sebastian. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-8349-3937-1">http://dx.doi.org/10.1007/978-3-8349-3937-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Quantum information processing and quantum error correction an engineering approachent://SD_ILS/0/SD_ILS:1472562024-11-15T12:29:52Z2024-11-15T12:29:52ZYazar Djordjevic, Ivan.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123854919">http://www.sciencedirect.com/science/book/9780123854919</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approachent://SD_ILS/0/SD_ILS:1734522024-11-15T12:29:52Z2024-11-15T12:29:52ZYazar Laurila, Tomi. author. Vuorinen, Vesa. author. Paulasto-Kröckel, Mervi. author. Turunen, Markus. author. Mattila, Toni T. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2470-2">http://dx.doi.org/10.1007/978-1-4471-2470-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Economic time series modeling and seasonalityent://SD_ILS/0/SD_ILS:2862332024-11-15T12:29:52Z2024-11-15T12:29:52ZYazar Bell, William R., 1943- Holan, Scott H. McElroy, Tucker.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439846582">Distributed by publisher. 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