Arama Sonuçları Error. - Daraltılmış: Engineering.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dError.$0026qf$003dSUBJECT$002509Subject$002509Engineering.$002509Engineering.$0026ps$003d300?2025-12-26T09:33:34ZGeneralized Gaussian Error Calculusent://SD_ILS/0/SD_ILS:1905832025-12-26T09:33:34Z2025-12-26T09:33:34ZYazar Grabe, Michael. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-03305-6">http://dx.doi.org/10.1007/978-3-642-03305-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Minimum Error Entropy Classificationent://SD_ILS/0/SD_ILS:3332192025-12-26T09:33:34Z2025-12-26T09:33:34ZYazar Marques de Sá, Joaquim P. author. Silva, Luís M.A. author. Santos, Jorge M.F. author. Alexandre, Luís A. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE(333219.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-3-642-29029-9">http://dx.doi.org/10.1007/978-3-642-29029-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Error Analysis with Applications in Engineeringent://SD_ILS/0/SD_ILS:2051192025-12-26T09:33:34Z2025-12-26T09:33:34ZYazar Kotulski, Zbigniew A. author. Szczepinski, Wojciech. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-90-481-3570-7">http://dx.doi.org/10.1007/978-90-481-3570-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Error Control for Network-on-Chip Linksent://SD_ILS/0/SD_ILS:1731782025-12-26T09:33:34Z2025-12-26T09:33:34ZYazar Fu, Bo. author. Ampadu, Paul. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4419-9313-7">http://dx.doi.org/10.1007/978-1-4419-9313-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Error Correction Codes for Non-Volatile Memoriesent://SD_ILS/0/SD_ILS:1701482025-12-26T09:33:34Z2025-12-26T09:33:34ZYazar Micheloni, R. author. Marelli, A. author. Ravasio, R. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4020-8391-4">http://dx.doi.org/10.1007/978-1-4020-8391-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Human Reliability and Error in Transportation Systemsent://SD_ILS/0/SD_ILS:1755782025-12-26T09:33:34Z2025-12-26T09:33:34ZYazar Dhillon, B. S. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-84628-812-8">http://dx.doi.org/10.1007/978-1-84628-812-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Human Error, Reliability, Resilience, and Performance Proceedings of the AHFE 2017 International Conference on Human Error, Reliability, Resilience, and Performance, July 17–21,2017, The Westin Bonaventure Hotel,Los Angeles, California, USAent://SD_ILS/0/SD_ILS:4018302025-12-26T09:33:34Z2025-12-26T09:33:34ZYazar Boring, Ronald Laurids. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-60645-3">https://doi.org/10.1007/978-3-319-60645-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Transient and Permanent Error Control for Networks-on-Chipent://SD_ILS/0/SD_ILS:1738192025-12-26T09:33:34Z2025-12-26T09:33:34ZYazar Yu, Qiaoyan. author. Ampadu, Paul. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4614-0962-5">http://dx.doi.org/10.1007/978-1-4614-0962-5</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approachent://SD_ILS/0/SD_ILS:1734522025-12-26T09:33:34Z2025-12-26T09:33:34ZYazar Laurila, Tomi. author. Vuorinen, Vesa. author. Paulasto-Kröckel, Mervi. author. Turunen, Markus. author. Mattila, Toni T. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-1-4471-2470-2">http://dx.doi.org/10.1007/978-1-4471-2470-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>CMOS Cascade Sigma-Delta Modulators for Sensors and Telecom Error Analysis and Practical Designent://SD_ILS/0/SD_ILS:1692762025-12-26T09:33:34Z2025-12-26T09:33:34ZYazar Río, R. del. author. Medeiro, F. author. Pérez-Verdú, B. author. Rosa, J. M. author. Rodríguez-V´zquez, Á. author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/1-4020-4776-2">http://dx.doi.org/10.1007/1-4020-4776-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>