Arama Sonuçları Failure time data analysis. - Daraltılmış: EnglishSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dFailure$002btime$002bdata$002banalysis.$0026qf$003dLANGUAGE$002509Dil$002509ENG$002509English$0026ic$003dtrue$0026ps$003d300?dt=list2025-12-08T07:03:30ZThe statistical analysis of failure time dataent://SD_ILS/0/SD_ILS:3018552025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Kalbfleisch, J. D. Prentice, Ross L.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118032985">http://dx.doi.org/10.1002/9781118032985</a>
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Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html">http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=708259">http://swb.eblib.com/patron/FullRecord.aspx?p=708259</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The statistical analysis of failure time dataent://SD_ILS/0/SD_ILS:1092642025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Kalbfleisch, J. D. Prentice, Ross L., ort. yaz.<br/>Yer Numarası QA276 .K215 2002<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>The statistical analysis of failure time dataent://SD_ILS/0/SD_ILS:519902025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Kalbfleich, J. D. Kalbfleisch, R. L., ort. yaz. Preatice, R. L., ort. yaz.<br/>Yer Numarası QA 270 K34 1980 1.K<br/>Format: Kitap<br/>Durum Sağlık Bilimleri Kütüphanesi~1<br/>The statistical analysis of failure time dataent://SD_ILS/0/SD_ILS:336632025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Kalbfleisch, J. D. Prentice, R. L., ort. yaz.<br/>Yer Numarası QA 270 K34 1980<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>The Statistical Analysis of Interval-censored Failure Time Dataent://SD_ILS/0/SD_ILS:1661942025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Sun, Jianguo. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-37119-2">http://dx.doi.org/10.1007/0-387-37119-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Predictive Analytics in System Reliabilityent://SD_ILS/0/SD_ILS:5267812025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Kumar, Vijay. editor. Pham, Hoang. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-05347-4">https://doi.org/10.1007/978-3-031-05347-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Data Management, Analytics and Innovation Proceedings of ICDMAI 2023ent://SD_ILS/0/SD_ILS:5277342025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Sharma, Neha. editor. Goje, Amol. editor. Chakrabarti, Amlan. editor. Bruckstein, Alfred M. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-1414-2">https://doi.org/10.1007/978-981-99-1414-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Advances in Internet, Data & Web Technologies The 11th International Conference on Emerging Internet, Data & Web Technologies (EIDWT-2023)ent://SD_ILS/0/SD_ILS:5283942025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Barolli, Leonard. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-26281-4">https://doi.org/10.1007/978-3-031-26281-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Dependable Computer Systems and Networks Proceedings of the Eighteenth International Conference on Dependability of Computer Systems DepCoS-RELCOMEX, July 3-7, 2023, Brunów, Polandent://SD_ILS/0/SD_ILS:5290252025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Zamojski, Wojciech. editor. Mazurkiewicz, Jacek. editor. Sugier, Jarosław. editor. Walkowiak, Tomasz. editor. Kacprzyk, Janusz. editor. (orcid)0000-0003-4187-5877<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-37720-4">https://doi.org/10.1007/978-3-031-37720-4</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>International Joint Conference 16th International Conference on Computational Intelligence in Security for Information Systems (CISIS 2023) 14th International Conference on EUropean Transnational Education (ICEUTE 2023) Proceedingsent://SD_ILS/0/SD_ILS:5291232025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar García Bringas, Pablo. editor. Pérez García, Hilde. editor. (orcid)0000-0001-7112-1983 Martínez de Pisón, Francisco Javier. editor. (orcid)0000-0002-3063-7374 Martínez Álvarez, Francisco. editor. Troncoso Lora, Alicia. editor. (orcid)0000-0002-9801-7999<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-42519-6">https://doi.org/10.1007/978-3-031-42519-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Biomedical and Computational Biology Second International Symposium, BECB 2022, Virtual Event, August 13-15, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5208042025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Wen, Shiping. editor. Yang, Cihui. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-25191-7">https://doi.org/10.1007/978-3-031-25191-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Handbook of Neuroengineeringent://SD_ILS/0/SD_ILS:5282102025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Thakor, Nitish V. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-16-5540-1">https://doi.org/10.1007/978-981-16-5540-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Numerical Methods for Reliability and Safety Assessment Multiscale and Multiphysics Systemsent://SD_ILS/0/SD_ILS:5292772025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Kadry, Seifedine. editor. El Hami, Abdelkhalak. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-07167-1">https://doi.org/10.1007/978-3-319-07167-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Proceedings of the 7th World Congress on Engineering Asset Management (WCEAM 2012)ent://SD_ILS/0/SD_ILS:5305182025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Lee, Woo Bang. editor. Choi, Byeongkuen. editor. Ma, Lin. editor. Mathew, Joseph. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-06966-1">https://doi.org/10.1007/978-3-319-06966-1</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Interval-censored time-to-event data : methods and applicationsent://SD_ILS/0/SD_ILS:5387212025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Chen, Ding-Geng. Sun, Jianguo, 1961- Peace, Karl E., 1941-<br/>Yer Numarası QA276 .I58 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466504288">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Multivariate survival analysis and competing risksent://SD_ILS/0/SD_ILS:5387632025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Crowder, M. J. (Martin J.), 1943, author.<br/>Yer Numarası QA276 .C83 2012<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439875223">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Frailty models in survival analysisent://SD_ILS/0/SD_ILS:5460092025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Wienke, Andreas., author.<br/>Yer Numarası QA280 .W54 2011<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420073911">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Survival analysis using the SAS system : a practical guideent://SD_ILS/0/SD_ILS:2492382025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Allison, Paul D.<br/>Yer Numarası QA276.4 A394 2010<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Practical reliability engineering and analysis for system design and life-cycle sustainmentent://SD_ILS/0/SD_ILS:5471962025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Wessels, William R., author.<br/>Yer Numarası TS173 .W45 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420094404">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Mathematical methods in survival analysis, reliability and quality of lifeent://SD_ILS/0/SD_ILS:2975432025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Huber, Catherine.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470610985">http://dx.doi.org/10.1002/9780470610985</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Computational methods in biomedical researchent://SD_ILS/0/SD_ILS:5420092025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Khattree, Ravindra. Naik, Dayanand N.<br/>Yer Numarası R853 .D37 C63 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420010923">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Counting processes and survival analysisent://SD_ILS/0/SD_ILS:3003442025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Fleming, Thomas R. Harrington, David P. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150672">An electronic book accessible through the World Wide Web; click for information</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10509867">http://site.ebrary.com/lib/alltitles/Doc?id=10509867</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated testing and validation testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:2541842025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Porter, Alex.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and analysis of accelerated tests for mission critical reliabilityent://SD_ILS/0/SD_ILS:5462542025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.<br/>Yer Numarası TA169.3 .L88 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical methods for survival data analysisent://SD_ILS/0/SD_ILS:3015122025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Lee, Elisa T. Wang, John Wenyu. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471458546">http://dx.doi.org/10.1002/0471458546</a>
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Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html">http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical models and methods for lifetime dataent://SD_ILS/0/SD_ILS:3018562025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Lawless, Jerald F., 1944-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118033005">http://dx.doi.org/10.1002/9781118033005</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html">http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated life models : modeling and statistical analysisent://SD_ILS/0/SD_ILS:5438282025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Bagdonavicius, V. (Vilijandas), author. Nikulin, M. S. (Mikhail Stepanovich)<br/>Yer Numarası TA169.3 .N55 2002<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420035872">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Subjective probability models for lifetimesent://SD_ILS/0/SD_ILS:5389342025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Spizzichino, F. (Fabio), 1948, author.<br/>Yer Numarası QA276 .S66 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420036138">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Classical competing risksent://SD_ILS/0/SD_ILS:758432025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Crowder, Martin J., 1943-<br/>Yer Numarası QA 273 C855 2001<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Bayesian survival analysisent://SD_ILS/0/SD_ILS:912192025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Ibrahim, Joseph George. Chen, Ming-Hui, 1961- Sinha, Debajyoti.<br/>Yer Numarası QA 276 I27 2001<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Classical competing risksent://SD_ILS/0/SD_ILS:5448452025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Crowder, M. J. (Martin J.), 1943, author.<br/>Yer Numarası QA273 .C855 2001<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420035902">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Environmental requirements for electromechanical and electronic equipmentent://SD_ILS/0/SD_ILS:2543392025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Tricker, Ray. Tricker, Samantha.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750639026">http://www.sciencedirect.com/science/book/9780750639026</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Survival analysis using the SAS system : a practical guideent://SD_ILS/0/SD_ILS:1130862025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Allison, Paul D.<br/>Yer Numarası QA276.4 A394 1995<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Accelerated testing statistical models, test plans and data analysesent://SD_ILS/0/SD_ILS:2952592025-12-08T07:03:30Z2025-12-08T07:03:30ZYazar Nelson, Wayne, 1936-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a>
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