Arama Sonuçları Failure time data analysis. - Daraltılmış: Reliability (Engineering)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dFailure$002btime$002bdata$002banalysis.$0026qf$003dSUBJECT$002509Konu$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ps$003d300?2025-12-09T22:43:51ZPractical reliability engineering and analysis for system design and life-cycle sustainmentent://SD_ILS/0/SD_ILS:5471962025-12-09T22:43:51Z2025-12-09T22:43:51ZYazar Wessels, William R., author.<br/>Yer Numarası TS173 .W45 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420094404">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated testing and validation testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:2541842025-12-09T22:43:51Z2025-12-09T22:43:51ZYazar Porter, Alex.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design and analysis of accelerated tests for mission critical reliabilityent://SD_ILS/0/SD_ILS:5462542025-12-09T22:43:51Z2025-12-09T22:43:51ZYazar LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.<br/>Yer Numarası TA169.3 .L88 2004<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781135436193">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>