Arama Sonuçları Failure time data analysis.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dFailure$002btime$002bdata$002banalysis.$0026pe$003dd$00253A$0026ps$003d300$0026isd$003dtrue?dt=list2024-12-28T17:08:39ZThe statistical analysis of failure time dataent://SD_ILS/0/SD_ILS:3018552024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Kalbfleisch, J. D. Prentice, Ross L.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118032985">http://dx.doi.org/10.1002/9781118032985</a>
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Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html">http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html</a>
<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=708259">http://swb.eblib.com/patron/FullRecord.aspx?p=708259</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The statistical analysis of failure time dataent://SD_ILS/0/SD_ILS:1092642024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Kalbfleisch, J. D. Prentice, Ross L., ort. yaz.<br/>Yer Numarası QA276 .K215 2002<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>The statistical analysis of failure time dataent://SD_ILS/0/SD_ILS:519902024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Kalbfleich, J. D. Kalbfleisch, R. L., ort. yaz. Preatice, R. L., ort. yaz.<br/>Yer Numarası QA 270 K34 1980 1.K<br/>Format: Kitap<br/>Durum Sağlık Bilimleri Kütüphanesi~1<br/>The statistical analysis of failure time dataent://SD_ILS/0/SD_ILS:336632024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Kalbfleisch, J. D. Prentice, R. L., ort. yaz.<br/>Yer Numarası QA 270 K34 1980<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>The Statistical Analysis of Interval-censored Failure Time Dataent://SD_ILS/0/SD_ILS:1661942024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Sun, Jianguo. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/0-387-37119-2">http://dx.doi.org/10.1007/0-387-37119-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Biomedical and Computational Biology Second International Symposium, BECB 2022, Virtual Event, August 13-15, 2022, Revised Selected Papersent://SD_ILS/0/SD_ILS:5208042024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Wen, Shiping. editor. Yang, Cihui. editor. SpringerLink (Online service)<br/>Yer Numarası XX(520804.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-25191-7">https://doi.org/10.1007/978-3-031-25191-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Interval-censored time-to-event data methods and applicationsent://SD_ILS/0/SD_ILS:2862422024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Chen, Ding-Geng. Sun, Jianguo, 1961- Peace, Karl E., 1941-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781466504288">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Multivariate survival analysis and competing risksent://SD_ILS/0/SD_ILS:2916242024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Crowder, M. J. (Martin J.), 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439875223">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Frailty models in survival analysisent://SD_ILS/0/SD_ILS:2878822024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Wienke, Andreas.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420073911">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Survival analysis using the SAS system : a practical guideent://SD_ILS/0/SD_ILS:2492382024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Allison, Paul D.<br/>Yer Numarası QA276.4 A394 2010<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Mathematical methods in survival analysis, reliability and quality of lifeent://SD_ILS/0/SD_ILS:2975432024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Huber, Catherine.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477625</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470610985">http://dx.doi.org/10.1002/9780470610985</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2007046232-b.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Counting processes and survival analysisent://SD_ILS/0/SD_ILS:3003442024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Fleming, Thomas R. Harrington, David P. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150672">An electronic book accessible through the World Wide Web; click for information</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10509867">http://site.ebrary.com/lib/alltitles/Doc?id=10509867</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Accelerated testing and validation testing, engineering, and management tools for lean developmentent://SD_ILS/0/SD_ILS:2541842024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Porter, Alex.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Volltext <a href="http://www.sciencedirect.com/science/book/9780750676533">http://www.sciencedirect.com/science/book/9780750676533</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical methods for survival data analysisent://SD_ILS/0/SD_ILS:3015122024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Lee, Elisa T. Wang, John Wenyu. John Wiley & Sons.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/0471458546">http://dx.doi.org/10.1002/0471458546</a>
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Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html">http://catdir.loc.gov/catdir/bios/wiley042/2002027025.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Statistical models and methods for lifetime dataent://SD_ILS/0/SD_ILS:3018562024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Lawless, Jerald F., 1944-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118033005">http://dx.doi.org/10.1002/9781118033005</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html">http://catdir.loc.gov/catdir/bios/wiley044/2002151805.html</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Classical competing risksent://SD_ILS/0/SD_ILS:2885932024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Crowder, M. J. (Martin J.), 1943-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420035902">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Subjective probability models for lifetimesent://SD_ILS/0/SD_ILS:2905012024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Spizzichino, F. (Fabio), 1948-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420036138">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Bayesian survival analysisent://SD_ILS/0/SD_ILS:912192024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Ibrahim, Joseph George. Chen, Ming-Hui, 1961- Sinha, Debajyoti.<br/>Yer Numarası QA 276 I27 2001<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Classical competing risksent://SD_ILS/0/SD_ILS:758432024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Crowder, Martin J., 1943-<br/>Yer Numarası QA 273 C855 2001<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Environmental requirements for electromechanical and electronic equipmentent://SD_ILS/0/SD_ILS:2543392024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Tricker, Ray. Tricker, Samantha.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750639026">http://www.sciencedirect.com/science/book/9780750639026</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Survival analysis using the SAS system : a practical guideent://SD_ILS/0/SD_ILS:1130862024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Allison, Paul D.<br/>Yer Numarası QA276.4 A394 1995<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>Accelerated testing statistical models, test plans and data analysesent://SD_ILS/0/SD_ILS:2952592024-12-28T17:08:39Z2024-12-28T17:08:39ZYazar Nelson, Wayne, 1936-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a>
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