Arama Sonuçları Field-effect transistors -- Testing.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dField-effect$002btransistors$002b--$002bTesting.$0026pe$003dd$00253A$0026ps$003d300?dt=list2024-10-19T11:51:02ZRF and microwave modeling and measurement techniques for field effect transistorsent://SD_ILS/0/SD_ILS:2809252024-10-19T11:51:02Z2024-10-19T11:51:02ZYazar Gao, Jianjun, 1968- Knovel (Firm)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defects in microelectronic materials and devicesent://SD_ILS/0/SD_ILS:2860102024-10-19T11:51:02Z2024-10-19T11:51:02ZYazar Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The RF transmission systems handbookent://SD_ILS/0/SD_ILS:2913342024-10-19T11:51:02Z2024-10-19T11:51:02ZYazar Whitaker, Jerry C.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420041132">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>