Arama Sonuçları Gan, Zhenghao. - Daraltılmış: English
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dGan$00252C$002bZhenghao.$0026qf$003dLANGUAGE$002509Dil$002509ENG$002509English$0026ps$003d300?
2025-03-15T07:36:27Z
Semiconductor process reliability in practice
ent://SD_ILS/0/SD_ILS:293479
2025-03-15T07:36:27Z
2025-03-15T07:36:27Z
Yazar Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
ent://SD_ILS/0/SD_ILS:168486
2025-03-15T07:36:27Z
2025-03-15T07:36:27Z
Yazar Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>