Arama Sonuçları IEEE - Daraltılmış: 1973SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIEEE$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025091973$0025091973$0026ps$003d300?dt=list2024-11-28T19:42:01ZIEEE spectrum.ent://SD_ILS/0/SD_ILS:2268112024-11-28T19:42:01Z2024-11-28T19:42:01ZYazar Institute of Electrical and Electronics Engineers.<br/>Yer Numarası ALFABETİK V.1967 OCT-1968 JUN<br/>Format: Devam Eden Süreli Yayınlar Diğer<br/>Durum Beytepe Kütüphanesi~7 ~0<br/>STRESS, a user's manual a problem-oriented computer language for structural engineeringent://SD_ILS/0/SD_ILS:2202662024-11-28T19:42:01Z2024-11-28T19:42:01ZYazar Massachusetts Institute of Technology. Department of Civil Engineering. Fenves, Steven J. (Steven Joseph)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276886">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276886</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Power-system reliability calculationsent://SD_ILS/0/SD_ILS:2201752024-11-28T19:42:01Z2024-11-28T19:42:01ZYazar Billinton, Roy. Ringlee, Robert J., joint author. Wood, Allen J., joint author.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276874</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>The principles of switching circuitsent://SD_ILS/0/SD_ILS:2202202024-11-28T19:42:01Z2024-11-28T19:42:01ZYazar Edwards, Frederick H.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276885">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276885</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>