Arama Sonuçları IEEE - Daraltılmış: Computer engineering.
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https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIEEE$0026qf$003dSUBJECT$002509Konu$002509Computer$002bengineering.$002509Computer$002bengineering.$0026ps$003d300?dt=list
2026-03-15T14:56:52Z
VLSI-SoC 2023: Innovations for Trustworthy Artificial Intelligence 31st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2023, Sharjah, United Arab Emirates, October 16-18, 2023, Revised Extended Selected Papers
ent://SD_ILS/0/SD_ILS:607124
2026-03-15T14:56:52Z
2026-03-15T14:56:52Z
Yazar Elfadel, Ibrahim (Abe) M. editor. (orcid)0000-0003-3220-9987 Albasha, Lutfi. editor. (orcid)0000-0001-5933-0280 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-70947-0">https://doi.org/10.1007/978-3-031-70947-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:618440
2026-03-15T14:56:52Z
2026-03-15T14:56:52Z
Yazar Hollstein, Thomas. editor. Raik, Jaan. editor. Kostin, Sergei. editor. Tšertov, Anton. editor. O'Connor, Ian. editor.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-67104-8">https://doi.org/10.1007/978-3-319-67104-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
ent://SD_ILS/0/SD_ILS:618293
2026-03-15T14:56:52Z
2026-03-15T14:56:52Z
Yazar Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-46097-0">https://doi.org/10.1007/978-3-319-46097-0</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems
ent://SD_ILS/0/SD_ILS:249594
2026-03-15T14:56:52Z
2026-03-15T14:56:52Z
Yazar Pukite, Jan, 1928- Pukite, Paul.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Security, Privacy, and Anonymity in Computation, Communication, and Storage SpaCCS 2017 International Workshops, Guangzhou, China, December 12-15, 2017, Proceedings
ent://SD_ILS/0/SD_ILS:611060
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2026-03-15T14:56:52Z
Yazar Wang, Guojun. editor. (orcid)0000-0001-9875-4182 Atiquzzaman, Mohammed. editor. Yan, Zheng. editor. Choo, Kim-Kwang Raymond. editor. (orcid)0000-0001-9208-5336 SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-72395-2">https://doi.org/10.1007/978-3-319-72395-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computer, network, software, and hardware engineering with applications
ent://SD_ILS/0/SD_ILS:249355
2026-03-15T14:56:52Z
2026-03-15T14:56:52Z
Yazar Schneidewind, Norman.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEEXplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6168884">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6168884</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>