Arama Sonuçları IEEE - Daraltılmış: Reliability (Engineering)SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIEEE$0026qf$003dSUBJECT$002509Konu$002509Reliability$002b$002528Engineering$002529$002509Reliability$002b$002528Engineering$002529$0026ps$003d300?2026-02-24T18:24:04ZMaintaining mission critical systems in a 24/7 environmentent://SD_ILS/0/SD_ILS:5962872026-02-24T18:24:04Z2026-02-24T18:24:04ZYazar Curtis, Peter M., author.<br/>Yer Numarası TA169 .C87 2021<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506133">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506133</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Maintaining Mission Critical Systems in a 24/7 Environmentent://SD_ILS/0/SD_ILS:2499252026-02-24T18:24:04Z2026-02-24T18:24:04ZYazar Curtis, Peter M., author. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047593</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Maintaining mission critical systems in a 24/7 environmentent://SD_ILS/0/SD_ILS:2494852026-02-24T18:24:04Z2026-02-24T18:24:04ZYazar Curtis, Peter M.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236749</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Designing high availability systems : design for Six Sigma and classical reliability techniques with practical real-life examplesent://SD_ILS/0/SD_ILS:3650012026-02-24T18:24:04Z2026-02-24T18:24:04ZYazar Taylor, Zachary, 1959- Ranganathan, Subramanyam. IEEE Xplore (Online Service), distributor. Wiley, publisher.<br/>Yer Numarası ONLINE(365001.1)<br/>Elektronik Erişim Abstract with links to resource <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6628863</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Reliability analysis of modern power systemsent://SD_ILS/0/SD_ILS:5990182026-02-24T18:24:04Z2026-02-24T18:24:04ZYazar Saket, R. K., editor. Sanjeevikumar, Padmanaban, 1978-<br/>Yer Numarası TA169 .S234 2024<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394226771</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design for reliabilityent://SD_ILS/0/SD_ILS:2493822026-02-24T18:24:04Z2026-02-24T18:24:04ZYazar Raheja, Dev. Gullo, Louis J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6266791</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Design for reliability information and computer-based systemsent://SD_ILS/0/SD_ILS:2498792026-02-24T18:24:04Z2026-02-24T18:24:04ZYazar Bauer, Eric.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732779</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Practical system reliabilityent://SD_ILS/0/SD_ILS:1531462026-02-24T18:24:04Z2026-02-24T18:24:04ZYazar Bauer, Eric. Zhang, Xuemei. Kimber, Douglas A.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=273294</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>