Arama Sonu&ccedil;lar&#305; IEEE Solid-State Circuits Council. - Daralt&#305;lm&#305;&#351;: Online Library SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIEEE$002bSolid-State$002bCircuits$002bCouncil.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ic$003dtrue$0026ps$003d300? 2025-12-31T00:28:20Z Semiconductor memories technology, testing, and reliability ent://SD_ILS/0/SD_ILS:249739 2025-12-31T00:28:20Z 2025-12-31T00:28:20Z Yazar&#160;Sharma, Ashok K.&#160;IEEE Solid-State Circuits Council.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Analog MOS integrated circuits, II ent://SD_ILS/0/SD_ILS:249583 2025-12-31T00:28:20Z 2025-12-31T00:28:20Z Yazar&#160;Gray, Paul R., 1942-&#160;Wooley, Bruce A., 1943-&#160;Brodersen, Robert W., 1945-&#160;IEEE Solid-State Circuits Council.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265692">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265692</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>