Arama Sonuçları IET, - Daraltılmış: Testing.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIET$00252C$0026qf$003dSUBJECT$002509Konu$002509Testing.$002509Testing.$0026ps$003d300?2026-01-03T03:24:31ZTheory and Practice of Modern Antenna Range Measurementsent://SD_ILS/0/SD_ILS:3649162026-01-03T03:24:31Z2026-01-03T03:24:31ZYazar Parini, Clive Gregson, Stuart McCormick, John Janse van Rensburg, Daniel<br/>Yer Numarası \(364916.1)<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBEW055E">http://dx.doi.org/10.1049/PBEW055E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High Voltage Engineering Testingent://SD_ILS/0/SD_ILS:2479232026-01-03T03:24:31Z2026-01-03T03:24:31ZYazar Ryan, Hugh M., ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBPO066E">http://dx.doi.org/10.1049/PBPO066E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Lean Product Development A manager's guideent://SD_ILS/0/SD_ILS:2478612026-01-03T03:24:31Z2026-01-03T03:24:31ZYazar Mynott, Colin<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBMT028E">http://dx.doi.org/10.1049/PBMT028E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approachent://SD_ILS/0/SD_ILS:2477572026-01-03T03:24:31Z2026-01-03T03:24:31ZYazar Yichuang Sun, ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBCS019E">http://dx.doi.org/10.1049/PBCS019E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electrical Steels for Rotating Machinesent://SD_ILS/0/SD_ILS:2479002026-01-03T03:24:31Z2026-01-03T03:24:31ZYazar Beckley, Philip<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBPO037E">http://dx.doi.org/10.1049/PBPO037E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>A Handbook for EMC Testing and Measurementent://SD_ILS/0/SD_ILS:2477692026-01-03T03:24:31Z2026-01-03T03:24:31ZYazar Morgan, David<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBEL008E">http://dx.doi.org/10.1049/PBEL008E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Spherical Near-field Antenna Measurementsent://SD_ILS/0/SD_ILS:2477952026-01-03T03:24:31Z2026-01-03T03:24:31ZYazar Hansen, J. E., ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBEW026E">http://dx.doi.org/10.1049/PBEW026E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>