Arama Sonuçları Industrial Safety - Daraltılmış: Electronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIndustrial$002bSafety$0026qf$003dSUBJECT$002509Konu$002509Electronics.$002509Electronics.$0026te$003dILS$0026ps$003d300?
2024-11-07T13:01:25Z
Bias Temperature Instability for Devices and Circuits
ent://SD_ILS/0/SD_ILS:484755
2024-11-07T13:01:25Z
2024-11-07T13:01:25Z
Yazar Grasser, Tibor. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4614-7909-3">https://doi.org/10.1007/978-1-4614-7909-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
ent://SD_ILS/0/SD_ILS:488642
2024-11-07T13:01:25Z
2024-11-07T13:01:25Z
Yazar Balasinski, Artur. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4614-1761-3">https://doi.org/10.1007/978-1-4614-1761-3</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability Engineering Theory and Practice
ent://SD_ILS/0/SD_ILS:489410
2024-11-07T13:01:25Z
2024-11-07T13:01:25Z
Yazar Birolini, Alessandro. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-642-39535-2">https://doi.org/10.1007/978-3-642-39535-2</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>