Arama Sonuçları Inspection. - Daraltılmış: 2006SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dInspection.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092006$0025092006$0026ic$003dtrue$0026ps$003d300?dt=list2025-03-19T19:12:12ZGeometrical dimensioning and tolerancing for design, manufacturing and inspection a handbook for geometrical product specifications using ISO and ASME standardsent://SD_ILS/0/SD_ILS:2544142025-03-19T19:12:12Z2025-03-19T19:12:12ZYazar Henzold, G. Henzold, G. Handbook of geometrical tolerancing.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750667388">http://www.sciencedirect.com/science/book/9780750667388</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Food chemical safetyent://SD_ILS/0/SD_ILS:764722025-03-19T19:12:12Z2025-03-19T19:12:12ZYazar Watson, David H., ed.<br/>Yer Numarası TX 537 F57 2001 V.1<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~2<br/>X-ray metrology in semiconductor manufacturingent://SD_ILS/0/SD_ILS:2874432025-03-19T19:12:12Z2025-03-19T19:12:12ZYazar Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420005653">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>