Arama Sonuçları Inspection. - Daraltılmış: Microelectronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dInspection.$0026qf$003dSUBJECT$002509Konu$002509Microelectronics.$002509Microelectronics.$0026ps$003d300?
2025-12-25T03:37:20Z
Optical inspection of microsystems
ent://SD_ILS/0/SD_ILS:542500
2025-12-25T03:37:20Z
2025-12-25T03:37:20Z
Yazar Osten, Wolfgang.<br/>Yer Numarası TS156.2 .O652 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420019162">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Novel Sensors for Food Inspection: Modelling, Fabrication and Experimentation
ent://SD_ILS/0/SD_ILS:489382
2025-12-25T03:37:20Z
2025-12-25T03:37:20Z
Yazar Abdul Rahman, Mohd Syaifudin. author. Mukhopadhyay, Subhas Chandra. author. Yu, Pak-Lam. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-04274-9">https://doi.org/10.1007/978-3-319-04274-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>