Arama Sonuçları Integrated circuits -- Defects.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIntegrated$002bcircuits$002b--$002bDefects.$0026ps$003d300?dt=list
2026-01-12T09:32:39Z
Testing for small-delay defects in nanoscale CMOS integrated circuits
ent://SD_ILS/0/SD_ILS:547467
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Yazar Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.<br/>Yer Numarası TK7871.99 .M44 T43 2014<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315217819">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Counterfeit Integrated Circuits Detection and Avoidance
ent://SD_ILS/0/SD_ILS:530174
2026-01-12T09:32:39Z
2026-01-12T09:32:39Z
Yazar Tehranipoor, Mark (Mohammad). author. Guin, Ujjwal. author. Forte, Domenic. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-11824-6">https://doi.org/10.1007/978-3-319-11824-6</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Defects in microelectronic materials and devices
ent://SD_ILS/0/SD_ILS:543196
2026-01-12T09:32:39Z
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Yazar Fleetwood, D. M. (Dan M.) Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Yer Numarası TK7871 .D44 2009<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420043778">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
High-speed VLSI interconnections
ent://SD_ILS/0/SD_ILS:249510
2026-01-12T09:32:39Z
2026-01-12T09:32:39Z
Yazar Goel, Ashok K., 1953-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>