Arama Sonuçları Integrated circuits -- Defects.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIntegrated$002bcircuits$002b--$002bDefects.$0026ps$003d300?dt=list2024-12-20T09:03:58ZTesting for small-delay defects in nanoscale CMOS integrated circuitsent://SD_ILS/0/SD_ILS:3428812024-12-20T09:03:58Z2024-12-20T09:03:58ZYazar Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.<br/>Yer Numarası ONLINE(342881.1)<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439829424">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Defects in microelectronic materials and devicesent://SD_ILS/0/SD_ILS:2860102024-12-20T09:03:58Z2024-12-20T09:03:58ZYazar Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>High-speed VLSI interconnectionsent://SD_ILS/0/SD_ILS:2495102024-12-20T09:03:58Z2024-12-20T09:03:58ZYazar Goel, Ashok K., 1953-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201516</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>