Arama Sonuçları Integrated circuits -- Fault tolerance.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIntegrated$002bcircuits$002b--$002bFault$002btolerance.$0026ps$003d300?dt=list2026-03-22T17:29:41ZStrain-engineered MOSFETsent://SD_ILS/0/SD_ILS:5434572026-03-22T17:29:41Z2026-03-22T17:29:41ZYazar Maiti, C. K., author. Maiti, T. K.<br/>Yer Numarası TK7871.99 .M44 M248 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781466503472">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>Radiation effects in semiconductorsent://SD_ILS/0/SD_ILS:5454602026-03-22T17:29:41Z2026-03-22T17:29:41ZYazar Iniewski, Krzysztof.<br/>Yer Numarası TK7871.85 .R317 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439826959">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>