Arama Sonuçları Integrated circuits -- Measurement.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIntegrated$002bcircuits$002b--$002bMeasurement.$0026ic$003dtrue$0026ps$003d300?dt=list2026-06-02T01:26:29ZGaN power devices for efficient power conversionent://SD_ILS/0/SD_ILS:5993732026-06-02T01:26:29Z2026-06-02T01:26:29ZYazar Lidow, Alex, author.<br/>Yer Numarası TK7871.95 .L53 2025<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286980">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286980</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Electromechanical coupling theory, methodology and applications for high-performance microwave equipmentent://SD_ILS/0/SD_ILS:5979802026-06-02T01:26:29Z2026-06-02T01:26:29ZYazar Duan, Baoyan, author. Zhang, Shuxin (Professor of electromechanical engineering), author.<br/>Yer Numarası TK7876 .D83 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Non-linearities in passive RFID systems : third harmonic concept and applicationsent://SD_ILS/0/SD_ILS:5942542026-06-02T01:26:29Z2026-06-02T01:26:29ZYazar Andía, Gianfranco, author. Duroc, Yvan, author. Tedjini, Smaïl, author.<br/>Yer Numarası TK6570 .I34<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119451426">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119451426</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>Silicon heterostructure handbook : materials, fabrication, devices, circuits, and applications of SiGe and Si strained-layer epitaxyent://SD_ILS/0/SD_ILS:5435052026-06-02T01:26:29Z2026-06-02T01:26:29ZYazar Cressler, John D.<br/>Yer Numarası TK7871.96 .B55 S55 2005<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420026580">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>X-ray metrology in semiconductor manufacturingent://SD_ILS/0/SD_ILS:5435112026-06-02T01:26:29Z2026-06-02T01:26:29ZYazar Bowen, D. Keith (David Keith), 1940- author. Tanner, B. K. (Brian Keith)<br/>Yer Numarası TK7874.58 .B69 2006<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420005653">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>