Arama Sonu&ccedil;lar&#305; Integrated circuits -- Reliability. - Daralt&#305;lm&#305;&#351;: English SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIntegrated$002bcircuits$002b--$002bReliability.$0026qf$003dLANGUAGE$002509Dil$002509ENG$002509English$0026ic$003dtrue$0026ps$003d300? 2024-12-10T08:42:59Z Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design ent://SD_ILS/0/SD_ILS:518551 2024-12-10T08:42:59Z 2024-12-10T08:42:59Z Yazar&#160;Fakhfakh, Mourad. editor.&#160;Tlelo-Cuautle, Esteban. editor.&#160;Siarry, Patrick. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;XX(518551.1)<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-19872-9">https://doi.org/10.1007/978-3-319-19872-9</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Terrestrial radiation effects in ULSI devices and electronic systems ent://SD_ILS/0/SD_ILS:342252 2024-12-10T08:42:59Z 2024-12-10T08:42:59Z Yazar&#160;Ibe, Eishi H., author.<br/>Yer Numaras&#305;&#160;ONLINE(342252.1)<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118479308">http://dx.doi.org/10.1002/9781118479308</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Green electronics manufacturing creating environmental sensible products ent://SD_ILS/0/SD_ILS:291642 2024-12-10T08:42:59Z 2024-12-10T08:42:59Z Yazar&#160;Wang, John X., 1962-<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://marc.crcnetbase.com/isbn/9781439826690">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Semiconductor process reliability in practice ent://SD_ILS/0/SD_ILS:293479 2024-12-10T08:42:59Z 2024-12-10T08:42:59Z Yazar&#160;Gan, Zhenghao.&#160;Wong, Waisum.&#160;Liou, Juin J.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> ESD failure mechanisms and models ent://SD_ILS/0/SD_ILS:298375 2024-12-10T08:42:59Z 2024-12-10T08:42:59Z Yazar&#160;Voldman, Steven H.&#160;Wiley InterScience (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Low-power HF Microelectronics A unified approach ent://SD_ILS/0/SD_ILS:247746 2024-12-10T08:42:59Z 2024-12-10T08:42:59Z Yazar&#160;Machado, Gerson A. S., ed.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="http://dx.doi.org/10.1049/PBCS008E">http://dx.doi.org/10.1049/PBCS008E</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Electronics reliability and measurement technology nondestructive evaluation ent://SD_ILS/0/SD_ILS:254151 2024-12-10T08:42:59Z 2024-12-10T08:42:59Z Yazar&#160;Heyman, Joseph S.<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>