Arama Sonuçları Integrated circuits -- Reliability. - Daraltılmış: Elektronik Kütüphane
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIntegrated$002bcircuits$002b--$002bReliability.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Elektronik$002bK$0025C3$0025BCt$0025C3$0025BCphane$0026ps$003d300?
2024-12-04T23:39:15Z
Terrestrial radiation effects in ULSI devices and electronic systems
ent://SD_ILS/0/SD_ILS:342252
2024-12-04T23:39:15Z
2024-12-04T23:39:15Z
Yazar Ibe, Eishi H., author.<br/>Yer Numarası ONLINE(342252.1)<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118479308">http://dx.doi.org/10.1002/9781118479308</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design
ent://SD_ILS/0/SD_ILS:518551
2024-12-04T23:39:15Z
2024-12-04T23:39:15Z
Yazar Fakhfakh, Mourad. editor. Tlelo-Cuautle, Esteban. editor. Siarry, Patrick. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518551.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19872-9">https://doi.org/10.1007/978-3-319-19872-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Green electronics manufacturing creating environmental sensible products
ent://SD_ILS/0/SD_ILS:291642
2024-12-04T23:39:15Z
2024-12-04T23:39:15Z
Yazar Wang, John X., 1962-<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://marc.crcnetbase.com/isbn/9781439826690">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor process reliability in practice
ent://SD_ILS/0/SD_ILS:293479
2024-12-04T23:39:15Z
2024-12-04T23:39:15Z
Yazar Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
ESD failure mechanisms and models
ent://SD_ILS/0/SD_ILS:298375
2024-12-04T23:39:15Z
2024-12-04T23:39:15Z
Yazar Voldman, Steven H. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Low-power HF Microelectronics A unified approach
ent://SD_ILS/0/SD_ILS:247746
2024-12-04T23:39:15Z
2024-12-04T23:39:15Z
Yazar Machado, Gerson A. S., ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBCS008E">http://dx.doi.org/10.1049/PBCS008E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electronics reliability and measurement technology nondestructive evaluation
ent://SD_ILS/0/SD_ILS:254151
2024-12-04T23:39:15Z
2024-12-04T23:39:15Z
Yazar Heyman, Joseph S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>