Arama Sonuçları Integrated circuits -- Reliability. - Daraltılmış: 2015
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIntegrated$002bcircuits$002b--$002bReliability.$0026qf$003dPUBDATE$002509Yay$0025C4$0025B1n$002bY$0025C4$0025B1l$0025C4$0025B1$0025092015$0025092015$0026ps$003d300?
2024-12-13T08:10:07Z
Terrestrial radiation effects in ULSI devices and electronic systems
ent://SD_ILS/0/SD_ILS:342252
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2024-12-13T08:10:07Z
Yazar Ibe, Eishi H., author.<br/>Yer Numarası ONLINE(342252.1)<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118479308">http://dx.doi.org/10.1002/9781118479308</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design
ent://SD_ILS/0/SD_ILS:518551
2024-12-13T08:10:07Z
2024-12-13T08:10:07Z
Yazar Fakhfakh, Mourad. editor. Tlelo-Cuautle, Esteban. editor. Siarry, Patrick. editor. SpringerLink (Online service)<br/>Yer Numarası XX(518551.1)<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19872-9">https://doi.org/10.1007/978-3-319-19872-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>