Arama Sonuçları Integrated circuits -- Testing. - Daraltılmış: Testen.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIntegrated$002bcircuits$002b--$002bTesting.$0026qf$003dSUBJECT$002509Konu$002509Testen.$002509Testen.$0026ps$003d300?
2026-01-03T03:34:48Z
VLSI test principles and architectures design for testability
ent://SD_ILS/0/SD_ILS:253779
2026-01-03T03:34:48Z
2026-01-03T03:34:48Z
Yazar Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123705976">http://www.sciencedirect.com/science/book/9780123705976</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Digital circuit testing a guide to DFT and other techniques
ent://SD_ILS/0/SD_ILS:255234
2026-01-03T03:34:48Z
2026-01-03T03:34:48Z
Yazar Wang, Francis C.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127345802">http://www.sciencedirect.com/science/book/9780127345802</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>