Arama Sonuçları Integrated circuits--Reliability.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIntegrated$002bcircuits--Reliability.$0026ic$003dtrue$0026ps$003d300?dt=list
2026-01-13T11:33:12Z
Lifetime Reliability-aware Design of Integrated Circuits
ent://SD_ILS/0/SD_ILS:527089
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Yazar Raji, Mohsen. author. Ghavami, Behnam. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-15345-7">https://doi.org/10.1007/978-3-031-15345-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Emerging Electronic Devices, Circuits and Systems Select Proceedings of EEDCS Workshop Held in Conjunction with ISDCS 2022
ent://SD_ILS/0/SD_ILS:526856
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Yazar Giri, Chandan. editor. Iizuka, Takahiro. editor. Rahaman, Hafizur. editor. Bhattacharya, Bhargab B. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-0055-8">https://doi.org/10.1007/978-981-99-0055-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Electrical Engineering Handbook - Six Volume Set
ent://SD_ILS/0/SD_ILS:542484
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Yazar Dorf, Richard C., editor. Taylor and Francis.<br/>Yer Numarası R857 .B54<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design
ent://SD_ILS/0/SD_ILS:518551
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Yazar Fakhfakh, Mourad. editor. Tlelo-Cuautle, Esteban. editor. Siarry, Patrick. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19872-9">https://doi.org/10.1007/978-3-319-19872-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Terrestrial radiation effects in ULSI devices and electronic systems
ent://SD_ILS/0/SD_ILS:342252
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Yazar Ibe, Eishi H., author.<br/>Yer Numarası ONLINE(342252.1)<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118479308">http://dx.doi.org/10.1002/9781118479308</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Micro-Relay Technology for Energy-Efficient Integrated Circuits
ent://SD_ILS/0/SD_ILS:529445
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Yazar Kam, Hei. author. Chen, Fred. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4939-2128-7">https://doi.org/10.1007/978-1-4939-2128-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Green electronics manufacturing : creating environmental sensible products
ent://SD_ILS/0/SD_ILS:546751
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Yazar Wang, John X., 1962, author.<br/>Yer Numarası TK7836 .W36 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439826690">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor process reliability in practice
ent://SD_ILS/0/SD_ILS:293479
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Yazar Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Radiation effects in semiconductors
ent://SD_ILS/0/SD_ILS:545460
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Yazar Iniewski, Krzysztof.<br/>Yer Numarası TK7871.85 .R317 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439826959">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
ESD failure mechanisms and models
ent://SD_ILS/0/SD_ILS:298375
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Yazar Voldman, Steven H. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of semiconductor manufacturing technology
ent://SD_ILS/0/SD_ILS:542441
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Yazar Doering, Robert, 1946- Nishi, Yoshio, 1940-<br/>Yer Numarası TK7871.85 .H3335 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315213934">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Bayesian process monitoring, control and optimization
ent://SD_ILS/0/SD_ILS:543995
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Yazar Colosimo, Bianca M. Del Castillo, Enrique.<br/>Yer Numarası TS156.8 .B39 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420010701">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Low-power HF Microelectronics A unified approach
ent://SD_ILS/0/SD_ILS:247746
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Yazar Machado, Gerson A. S., ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBCS008E">http://dx.doi.org/10.1049/PBCS008E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electronics reliability and measurement technology nondestructive evaluation
ent://SD_ILS/0/SD_ILS:254151
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Yazar Heyman, Joseph S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>