Arama Sonuçları Integrated circuits--Reliability.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIntegrated$002bcircuits--Reliability.$0026ic$003dtrue$0026ps$003d300?
2026-03-03T11:16:40Z
Lifetime Reliability-aware Design of Integrated Circuits
ent://SD_ILS/0/SD_ILS:527089
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Yazar Raji, Mohsen. author. Ghavami, Behnam. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-031-15345-7">https://doi.org/10.1007/978-3-031-15345-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Emerging Electronic Devices, Circuits and Systems Select Proceedings of EEDCS Workshop Held in Conjunction with ISDCS 2022
ent://SD_ILS/0/SD_ILS:526856
2026-03-03T11:16:40Z
2026-03-03T11:16:40Z
Yazar Giri, Chandan. editor. Iizuka, Takahiro. editor. Rahaman, Hafizur. editor. Bhattacharya, Bhargab B. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-981-99-0055-8">https://doi.org/10.1007/978-981-99-0055-8</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
75th anniversary of the transistor
ent://SD_ILS/0/SD_ILS:598494
2026-03-03T11:16:40Z
2026-03-03T11:16:40Z
Yazar Nathan, Arokia, 1957- editor. Saha, Samar K., editor. Todi, Ravi M., editor.<br/>Yer Numarası TK7871.9<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electromechanical coupling theory, methodology and applications for high-performance microwave equipment
ent://SD_ILS/0/SD_ILS:597980
2026-03-03T11:16:40Z
2026-03-03T11:16:40Z
Yazar Duan, Baoyan, author. Zhang, Shuxin (Professor of electromechanical engineering), author.<br/>Yer Numarası TK7876 .D83 2023<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119904427</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Practical ESD protection design
ent://SD_ILS/0/SD_ILS:597233
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Yazar Wang, Albert Z. H., 1962- author.<br/>Yer Numarası TK7874<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
The Electrical Engineering Handbook - Six Volume Set
ent://SD_ILS/0/SD_ILS:542484
2026-03-03T11:16:40Z
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Yazar Dorf, Richard C., editor. Taylor and Francis.<br/>Yer Numarası R857 .B54<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420049756">Click here to view.</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Reliability of maintained systems subjected to wear failure mechanisms : theory and applications
ent://SD_ILS/0/SD_ILS:595240
2026-03-03T11:16:40Z
2026-03-03T11:16:40Z
Yazar Bayle, Franck, author.<br/>Yer Numarası TA169<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of 3D integration. Volume 4, Design, test, and thermal management
ent://SD_ILS/0/SD_ILS:595051
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Yazar Franzon, Paul D., editor. Marinissen, Eric Jan, editor. Bakir, Muhannad S., editor.<br/>Yer Numarası TK7874.893 .H36 2019<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
3D IC and RF SiPs : advanced stacking and planar solutions for 5G mobility
ent://SD_ILS/0/SD_ILS:594223
2026-03-03T11:16:40Z
2026-03-03T11:16:40Z
Yazar Hwang, Lih-Tyng, author. Horng, Tzyy-sheng Jason, author.<br/>Yer Numarası TK5103.2<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119289654">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119289654</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Real-time embedded systems
ent://SD_ILS/0/SD_ILS:593770
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Yazar Wang, Jiacun, 1963- author.<br/>Yer Numarası TK7895 .E42<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119420712</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Nanoelectronics : materials, devices, applications
ent://SD_ILS/0/SD_ILS:593621
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Yazar Puers, R., editor.<br/>Yer Numarası TK7874.84<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Physics and Technology of Crystalline Oxide Semiconductor CAAC-IGZO : Application to Displays
ent://SD_ILS/0/SD_ILS:593178
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Yazar Yamazaki, Shunpei, editor. Tsutsui, Tetsuo, editor.<br/>Yer Numarası TK7871.85<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119247395">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119247395</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design
ent://SD_ILS/0/SD_ILS:518551
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Yazar Fakhfakh, Mourad. editor. Tlelo-Cuautle, Esteban. editor. Siarry, Patrick. editor. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-3-319-19872-9">https://doi.org/10.1007/978-3-319-19872-9</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Terrestrial radiation effects in ULSI devices and electronic systems
ent://SD_ILS/0/SD_ILS:342252
2026-03-03T11:16:40Z
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Yazar Ibe, Eishi H., author.<br/>Yer Numarası ONLINE(342252.1)<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9781118479308">http://dx.doi.org/10.1002/9781118479308</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Micro-Relay Technology for Energy-Efficient Integrated Circuits
ent://SD_ILS/0/SD_ILS:529445
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Yazar Kam, Hei. author. Chen, Fred. author. SpringerLink (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="https://doi.org/10.1007/978-1-4939-2128-7">https://doi.org/10.1007/978-1-4939-2128-7</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Green electronics manufacturing : creating environmental sensible products
ent://SD_ILS/0/SD_ILS:546751
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Yazar Wang, John X., 1962, author.<br/>Yer Numarası TK7836 .W36 2013<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439826690">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Semiconductor process reliability in practice
ent://SD_ILS/0/SD_ILS:293479
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Yazar Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Radiation effects in semiconductors
ent://SD_ILS/0/SD_ILS:545460
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Yazar Iniewski, Krzysztof.<br/>Yer Numarası TK7871.85 .R317 2010<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781439826959">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
ESD failure mechanisms and models
ent://SD_ILS/0/SD_ILS:298375
2026-03-03T11:16:40Z
2026-03-03T11:16:40Z
Yazar Voldman, Steven H. Wiley InterScience (Online service)<br/>Yer Numarası ONLINE<br/>Elektronik Erişim John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Probability with R : an introduction with computer science applications
ent://SD_ILS/0/SD_ILS:595725
2026-03-03T11:16:40Z
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Yazar Horgan, Jane M., 1947-<br/>Yer Numarası QA76.9 .M35 H863 2009 EB<br/>Elektronik Erişim <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119536963">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119536963</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Handbook of semiconductor manufacturing technology
ent://SD_ILS/0/SD_ILS:542441
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Yazar Doering, Robert, 1946- Nishi, Yoshio, 1940-<br/>Yer Numarası TK7871.85 .H3335 2008<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781315213934">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Bayesian process monitoring, control and optimization
ent://SD_ILS/0/SD_ILS:543995
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Yazar Colosimo, Bianca M. Del Castillo, Enrique.<br/>Yer Numarası TS156.8 .B39 2007<br/>Elektronik Erişim <a href="https://www.taylorfrancis.com/books/9781420010701">Click here to view.</a><br/>Format: Kitap<br/>Durum Çevrimiçi Kütüphane~1<br/>
Low-power HF Microelectronics A unified approach
ent://SD_ILS/0/SD_ILS:247746
2026-03-03T11:16:40Z
2026-03-03T11:16:40Z
Yazar Machado, Gerson A. S., ed.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim <a href="http://dx.doi.org/10.1049/PBCS008E">http://dx.doi.org/10.1049/PBCS008E</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>
Electronics reliability and measurement technology nondestructive evaluation
ent://SD_ILS/0/SD_ILS:254151
2026-03-03T11:16:40Z
2026-03-03T11:16:40Z
Yazar Heyman, Joseph S.<br/>Yer Numarası ONLINE<br/>Elektronik Erişim ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780815511717">http://www.sciencedirect.com/science/book/9780815511717</a><br/>Format: Elektrnik Kaynak<br/>Durum Çevrimiçi Kütüphane~1<br/>