Arama Sonu&ccedil;lar&#305; Integrated circuits--Reliability. - Daralt&#305;lm&#305;&#351;: Microprocessors. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIntegrated$002bcircuits--Reliability.$0026qf$003dSUBJECT$002509Konu$002509Microprocessors.$002509Microprocessors.$0026ps$003d300?dt=list 2026-03-15T22:40:58Z Fundamentals of Electromigration-Aware Integrated Circuit Design ent://SD_ILS/0/SD_ILS:607413 2026-03-15T22:40:58Z 2026-03-15T22:40:58Z Yazar&#160;Lienig, Jens. author. (orcid)0000-0002-2140-4587&#160;Rothe, Susann. author.&#160;Thiele, Matthias. author.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-031-80023-8">https://doi.org/10.1007/978-3-031-80023-8</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/> Carbon Nanotubes for Interconnects Process, Design and Applications ent://SD_ILS/0/SD_ILS:614055 2026-03-15T22:40:58Z 2026-03-15T22:40:58Z Yazar&#160;Todri-Sanial, Aida. editor.&#160;Dijon, Jean. editor.&#160;Maffucci, Antonio. editor.&#160;SpringerLink (Online service)<br/>Yer Numaras&#305;&#160;ONLINE<br/>Elektronik Eri&#351;im&#160;<a href="https://doi.org/10.1007/978-3-319-29746-0">https://doi.org/10.1007/978-3-319-29746-0</a><br/>Format:&#160;Elektrnik Kaynak<br/>Durum&#160;&Ccedil;evrimi&ccedil;i K&uuml;t&uuml;phane~1<br/>