Arama Sonuçları Integrated circuits--Testing. - Daraltılmış: Beytepe Library
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/tr_TR/default_tr/default_tr/qu$003dIntegrated$002bcircuits--Testing.$0026qf$003dLIBRARY$002509Library$0025091$00253ABEYTEPE$002509Beytepe$002bLibrary$0026ps$003d300?
2025-12-25T13:14:16Z
Digital integrated circuits : design-for-test using Simulink and Stateflow
ent://SD_ILS/0/SD_ILS:109724
2025-12-25T13:14:16Z
2025-12-25T13:14:16Z
Yazar Perelroyzen, Evgeni.<br/>Yer Numarası TK7874 .P445 2007<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
ent://SD_ILS/0/SD_ILS:392732
2025-12-25T13:14:16Z
2025-12-25T13:14:16Z
Yazar Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-<br/>Yer Numarası TK7874.75 B87 2000<br/>Format: Kitap<br/>Durum Beytepe Kütüphanesi~1<br/>